US Patent No. 9,824,452

TOPOGRAPHICAL MEASUREMENT SYSTEM OF SPECULAR OBJECT AND TOPOGRAPHICAL MEASUREMENT METHOD THEREOF


Patent No. 9,824,452
Issue Date November 21, 2017
Title Topographical Measurement System Of Specular Object And Topographical Measurement Method Thereof
Inventorship Wei-hung Su, Kaohsiung (TW)
Bo-chin Huang, Kaohsiung (TW)
Assignee NATIONAL SUN YAT-SEN UNIVERSITY, Kaohsiung (TW)

Claim of US Patent No. 9,824,452

1. A topographical measurement system for a specular object, comprising:
a screen including a display plane and a fringe pattern, wherein the fringe pattern is displayed on the display plane, the
specular object includes a to-be-measured surface arranged corresponding to the display plane, and the fringe pattern is projected
onto the to-be-measured surface of the specular object to reflect and form a virtual image;

an image capturing device opposite the to-be-measured surface of the specular object for capturing the virtual image; and
an image processing device electrically connected to the image capturing device for calculating a surface profile of the to-be-measured
surface according to the virtual image.