US Patent No. 11,112,301

METHOD FOR CORRECTING OPTICAL SENSOR ARRAY MODULE THROUGH CHARACTERISTIC EVALUATION


Patent No. 11,112,301
Issue Date September 07, 2021
Title Method For Correcting Optical Sensor Array Module Through Characteristic Evaluation
Inventorship Jong Muk Lee, Seoul (KR)
Tae Young Lee, Asan-si (KR)
Jae In Kim, Seoul (KR)
Assignee SOL INC., Seoul (KR)

Claim of US Patent No. 11,112,301


1. A method for correcting an optical sensor array through characteristic evaluation, the method comprising:setting at least one of an exposure time, an analog gain, a digital gain and a frame rate of the optical sensor array to be a default value;
statistically measuring a collection characteristic of the optical sensor array with the default value, according to a wavelength or an intensity of a standard light source having a predetermined characteristic value;
calculating a planarization calibration value for planarizing a collection characteristic value of the optical sensor array according to a wavelength change of the standard light source;
calculating a linearity calibration value for linearizing a collection characteristic value of the optical sensor array according to the intensity of the standard light source; and
performing a planarization calibration and a linearity calibration on the collection characteristics of each pixel of the optical sensor array using the planarization calibration value and the linearity calibration value.