US Patent No. 10,960,590

STATE DETERMINATION DEVICE


Patent No. 10,960,590
Issue Date March 30, 2021
Title State Determination Device
Inventorship Hiroyasu Asaoka, Yamanashi (JP)
Atsushi Horiuchi, Yamanashi (JP)
Kenjirou Shimizu, Yamanashi (JP)
Assignee FANUC CORPORATION, Yamanashi (JP)

Claim of US Patent No. 10,960,590

1. A state determination device for determining a state of a manufacturing device based on internal and external state variables acquired from an operation of the manufacturing device, the state determination device comprising:a processor configured to implement:
a primary determination learning model that has learned an outline of the state of the manufacturing device based on the internal and external state variables acquired from the operation of the manufacturing device for manufacturing a product,
a secondary determination learning model that has learned a state of the manufacturing device based on the internal and external state variables acquired from the operation of the manufacturing device in a predetermined operation pattern set in advance and information on maintenance of the manufacturing device, and
a determination result output unit configured to carry out
a primary determination on the outline of the state of the manufacturing device using the primary determination learning model based on the internal and external state variables acquired from the operation of the manufacturing device for manufacturing the product, and
a secondary determination on the state of the manufacturing device using the secondary determination learning model based on the internal and external state variables acquired from the operation of the manufacturing device in the predetermined operation pattern set in advance executed at a predetermined opportunity,
wherein the processor is configured to control the operation of the manufacturing device based on results of the primary determination and the secondary determination, and
the internal and external state variables for the secondary determination include a detection value of a sensor, the detection value being not included in the internal and external state variables for the primary determination.