US Patent No. 10,809,672

MEASUREMENT SYSTEM


Patent No. 10,809,672
Issue Date October 20, 2020
Title Measurement System
Inventorship Noriaki Hatanaka, Yamanashi (JP)
Assignee FANUC CORPORATION, Yamanashi (JP)

Claim of US Patent No. 10,809,672

1. A measurement system comprising:a control device which controls a control target device in real time and transmits control data for controlling the control target device to a terminal device; and
a measuring instrument which acquires data indicating a physical status of the control target device and transmits the data as measurement data to the terminal device, wherein
the control device includes a control unit and a sequence control unit, the control unit transmitting a timing signal to the measuring instrument using a signal output device without using the sequence control unit, the control unit transmitting other signals using the sequence control unit, wherein the sequence control unit operates at a predetermined control interval,
the control device transmits, to the terminal device, the control data that includes a first piece of time information based on the timing signal transmitted to the measuring instrument using the sequence control unit,
the measuring instrument transmits, to the terminal device, the measurement data that includes a second piece of time information based on the timing signal from the control unit, and
the terminal device compensates for a delay between the control data and the measurement data on the basis of the first piece and second piece of time information, wherein the delay is the time interval required for the timing signal transmitted from the control unit to the measuring instrument.