US Patent No. 10,772,153

METHODS AND APPARATUS FOR TWO-STAGE ACK/DTX DETECTION


Patent No. 10,772,153
Issue Date September 08, 2020
Title Methods And Apparatus For Two-stage Ack/dtx Detection
Inventorship Yuanbin Guo, Mountain House, CA (US)
Hong Jik Kim, San Jose, CA (US)
Assignee CAVIUM, LLC., Santa Clara, CA (US)

Claim of US Patent No. 10,772,153

1. A method, comprising:determining a first stage DTX value from bit-domain correlation values;
determining a second stage DTX value from symbol domain correlation values; and
determining a DTX decision based on the first stage DTX value and the second stage DTX value.