US Patent No. 10,660,251


Patent No. 10,660,251
Issue Date May 19, 2020
Title Inspection Device
Inventorship Akira Ito, Toyota (JP)
Assignee FUJI CORPORATION, Chiryu-shi (JP)

Claim of US Patent No. 10,660,251

1. An inspection device provided in a mounter that picks up a component supplied from a component supply device and mounts the component on a circuit board, the inspection device comprising:a holding table configured to hold a component;
a measuring section provided with a pair of measuring elements configured to move towards and away from each other so as to grip and release the component, and configured to measure electrical characteristics of a component using the pair of measuring elements;
a relative movement device configured to relatively move the pair of measuring elements and the holding table; and
a sorting and collecting device configured to separate and collect the component released from the pair of measurement elements into one of a plurality of collection devices by relatively moving the pair of measuring elements and the holding table between entrances of the collection devices by control of the relative movement device based on measurement results of the electrical characteristics of the component as measured by the measurement section.