US Patent No. 10,585,270

REFLECTED IMAGE MACROSCOPY SYSTEM


Patent No. 10,585,270
Issue Date March 10, 2020
Title Reflected Image Macroscopy System
Inventorship Nathan R Tykocki, Essex Junction, VT (US)
Grant Hennig, Essex Junction, VT (US)
Assignee University of Vermont and State Agricultural College, Burlington, VT (US)

Claim of US Patent No. 10,585,270

1. A multi-plane imaging apparatus for imaging multiple reflection planes of a regular or irregular shaped three-dimensional (3D) specimen, having top, side and bottom views simultaneously, the apparatus comprising:A body, wherein the body comprises:
a base having a base horizontal plane;
an inverted watertight pyramid well having at least four reflective side surfaces for reflecting the specimen side views, wherein each of the at least four reflective sides surfaces define an angle, ?, relative to the base horizontal plane, and wherein each reflective side surface comprises a plurality of reflective zones;
a specimen mounting apparatus positioned horizontally equidistant from the at least four reflective side surfaces and positioned vertically from the base horizontal plane a predetermined vertical distance;
wherein the predetermined vertical distance, the at least four reflective side surfaces, and the angle ? comprise a bottom reflection image plane for reflecting the specimen bottom views;
a solution controller for regulating a first solution in the inverted watertight pyramid well, wherein the solution controller further comprises a lighting apparatus for illuminating the specimen in the regulated first solution, wherein the lighting apparatus comprises an Ultra Violet (UV) lighting apparatus for exciting molecules within the specimen in the regulated first solution;
an imaging device, wherein the imaging device is disposed to capture the specimen top view, and the reflected side and bottom views substantially simultaneously; and
a non-transitory computer readable storage medium having computer readable code thereon, the medium including instructions for determining an index of refraction associated with the regulated and illuminated first solution and instructions for rendering a 3D image of the specimen top view and the reflected side and bottom views as a function of the determined index of refraction associated with the regulated and illuminated first solution.