US Patent No. 10,219,363

XRF ANALYZER WITH SEPARATE SOURCE AND DETECTOR HEAT SINKS


Patent No. 10,219,363
Issue Date February 26, 2019
Title Xrf Analyzer With Separate Source And Detector Heat Sinks
Inventorship Vincent Floyd Jones, Cedar Hills, UT (US)
Daniel N. Paas, Spanish Fork, UT (US)
Assignee Moxtek, Inc., Orem, UT (US)

Claim of US Patent No. 10,219,363

1. A portable x-ray fluorescence (XRF) analyzer comprising:an x-ray source and an x-ray detector;
an x-ray source heat-sink adjacent a side of the x-ray source;
an x-ray detector heat-sink adjacent a side of the x-ray detector;
the x-ray source heat-sink separated from the x-ray detector heat sink by a material having a thermal conductivity of less than 20 W/(m*K).