US Patent No. 10,084,983

WAFER-SCALE PIXELATED DETECTOR SYSTEM


Patent No. 10,084,983
Issue Date September 25, 2018
Title Wafer-scale Pixelated Detector System
Inventorship Farah Fahim, Glen Ellyn, IL (US)
Grzegorz Deptuch, Forest Park, IL (US)
Tom Zimmerman, St. Charles, IL (US)
Assignee Fermi Research Alliance, LLC, Batavia, IL (US)

Claim of US Patent No. 10,084,983

19. A system comprising:a readout circuit, said readout circuit further comprising:
a front end comprising:
a current splitter configured between an input signal source and at least one integrator, said current splitter providing an output signal to said at least one integrator;
a plurality of bipolar transistors configured to control said current splitter scaling factors to minimize split ratio errors;
a range selection logic, a multiplexor and at least one voltage buffer which are configured to store an integration performed by said at least one integrator for a desired gain range in a capacitor storage array;
a sample switch opened at an end of an integration period and configured between a cascode transistor and an integrator capacitor;
a cascode transistor separating said sample switch and said at least one integrator; and
a back end configured to read out said capacitor storage array.