US Pat. No. 10,511,313

PHASE-DETECTING METHOD AND CIRCUIT FOR TESTING A DELAY LOCKED LOOP/DELAY LINE

Goke Taiwan Research Labo...

1. A phase-detecting circuit for testing an under-test circuit (20) of a semiconductor device under control of a testing station, the phase-detecting circuit comprising:a frequency-multiplying circuit (12) comprising:
a first input connected to an input of the under-test circuit (20) in parallel to receive an input signal of the under-test circuit (20); and
a second input connected to an output of the under-test circuit (20) to receive an output signal of the under-test circuit (20) with a phase shift from the input signal of the under-test circuit (20);
wherein the frequency-multiplying circuit (12) combines the input and output signals of the under-test circuit (20) with each other, and accordingly generates a frequency-doubled signal;
a comparing circuit (14) comprising:
a first input connected to an output of the frequency-multiplying circuit (12) to receive a frequency-doubled signal; and
a second input connected to a reference signal source to receive a reference clock signal;
wherein the comparing circuit (14) compares the frequency-doubled signal with the reference clock signal and accordingly generates a difference signal, wherein the clock frequency of the reference signal is twice as much as that of the input signal of the under-test circuit (20) and the phase of the reference signal is close to that of the input signal of the under-test circuit (20);
a glitch filter (16) comprising an input connected to an output of the comparing circuit (14) to receive the difference signal between the reference clock and the frequency-doubled signal, wherein the glitch filter (16) filters the difference signal, and accordingly generates a filtered signal;
a determining and reporting circuit (18) comprising an input connected to an output of the glitch filter (16) to receive the filtered signal, wherein the determining and reporting circuit (18) determines whether the filtered signal is in an acceptable range, and accordingly reports a result to the testing station.

US Pat. No. 10,990,157

WIDE-RANGE PCIE POWER-MEASURING APPARATUS

Goke Taiwan Research Labo...

1. A wide-range power-measuring apparatus for measuring power of a Peripheral Component Interconnect Express device in various modes under the control of a testing host, the wide-range power-measuring apparatus comprising:a first Peripheral Component Interconnect Express bus port electrically connected to the testing host in operation;
a second Peripheral Component Interconnect Express bus port electrically connected to the Peripheral Component Interconnect Express device in operation;
a microcontroller unit in communication of electricity and signals with the testing host via the first Peripheral Component Interconnect Express bus port;
a current-measuring unit in communication of electricity and signals with the Peripheral Component Interconnect Express device via the second Peripheral Component Interconnect Express bus port, wherein the current-measuring unit comprises large and small current-measuring paths electrically connected to the microcontroller unit so that the current-measuring unit can sample and measure currents via a selected one of the large and small current-measuring paths under the control of the microcontroller unit; and
a switch unit electrically connected to the first Peripheral Component Interconnect Express bus port, wherein the switch unit comprises a first switch corresponding to the large current-measuring path and a second switch corresponding to the small current-measuring path so that one of the first and second switches is turned to a closed position to transfer electricity to the Peripheral Component Interconnect Express device from the corresponding one of the large and small current-measuring paths and the other one of the first and second switches is turned to an open position to block electricity from the Peripheral Component Interconnect Express device under the control of the testing host.