US Pat. No. 9,188,424

INTERFEROMETER

DR. JOHANNES HEIDENHAIN G...

1. An interferometer, comprising
a light source adapted to emit a beam of rays;
a beam splitter adapted to split the beam of rays emitted by the light source into a measurement beam and a reference beam;
a measuring arm extending in a first direction, in which the measurement beam propagates between the beam splitter and a measuring
reflector, the measuring reflector adapted to bring about an offset perpendicular to a direction of incidence between the
measurement beam that impinges on the measuring reflector and the measurement beam that is reflected back by the measuring
reflector;

a reference arm extending in a second direction, in which the reference beam propagates between the beam splitter and a reference
reflector; and

a detector system, to which superposed and recombined measurement beam and reference beam are suppliable, and adapted to generate
a distance-dependent interference signal with respect to a position of the measuring reflector;

wherein the measuring reflector includes at least one transmission grating and reflector element.

US Pat. No. 9,389,065

POSITION-MEASURING DEVICE AND SYSTEM HAVING SUCH A POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device for measuring a position of a first object relative to a second object, the first object and
the second object being movable relative to one another along at least two measuring directions, comprising:
an optical unit attachable to one of the objects and including at least one light source, a detector system, and further optical
elements in a defined configuration; and

a measuring standard-reflector unit attachable to the other object and including at least two differently formed regions in
one track that are optically scannable by the optical unit for position sensing;

wherein the different formation of the regions provide for switching among the measuring directions during position sensing;
and

wherein the optical unit is adapted to generate positional signals in accordance with relative movement of the two objects
for each measuring direction.

US Pat. No. 9,291,481

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for detecting a position of an object in several degrees of freedom, the object being
movable at least along a first direction of movement and along a second direction of movement, comprising:
at least one light source;
at least one first measuring standard, arranged on the object, extending along a first extension direction and including graduation
regions arranged periodically along the first extension direction;

at least one second measuring standard, arranged on the object, which extending along a second extension direction and including
graduation regions arranged periodically along the second extension direction;

a single scanning plate, including integrated first and second retroreflector elements, a length direction of the first retroreflector
element extending parallel to the first extension direction and a length direction of the second retroreflector element extending
parallel to the second extension direction, the first and second retroreflector elements adapted to reflect back in a direction
of a respective measuring standard sub-beams that fall on the first and second retroreflectors from the first and second measuring
standards; and

a detector system adapted to generate, from superposed sub-beams, at least position signals with respect to movement of the
object along the first and second directions of movement;

wherein the retroreflector elements are arranged as diffractive retroreflector elements, including:
a plurality of diffractive elements provided on a first side of the scanning plate;
and at least one reflector element that is provided on an opposite second side of the scanning plate and having a reflective
side oriented in a direction of the diffractive elements, the reflector element extending parallel to the first extension
direction or the second extension direction.

US Pat. No. 9,080,857

DEVICE FOR INTERFERENTIAL DISTANCE MEASUREMENT

DR. JOHANNES HEIDENHAIN G...

1. A device for interferential distance measurement, comprising:
a light source that emits a light beam along a propagation direction;
a scanning plate comprising a splitter that splits said light beam into a measurement beam and a reference beam;
a reflector disposed spaced-apart in a direction of said propagation direction, wherein said reflector is embodied as a plane
mirror and is movable with respect to said scanning plate along an axis which is perpendicular to a surface of said reflector;

a detector element, wherein said measurement beam and said reference beam are propagated from said splitter along different
optical paths toward said reflector, where a back reflection of said measurement beam and said reference beam occurs at said
surface of said reflector toward said scanning plate, and wherein at a combining location said measurement beam and said reference
beam attain interfering superposition, and wherein said measurement beam and said reference beam interfering at said combining
location are detected by said detector element so that said detector element generates a distance signal regarding a distance
between said scanning plate and said reflector along said axis; and

a signal processing unit that has a structure to receive said distance signal from said detector element and determine said
distance based on said distance signal.

US Pat. No. 10,060,765

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for determining the position of a first object relative to a second object which is movable relative to the first object along at least one measurement direction, the optical position-measuring device comprising:a scale connected to the first object and extending along the measurement direction, the scale including at least one measuring graduation composed of graduation regions which are alternately arranged along the measuring direction and have different optical properties; and
a scanner connected to the second object and including at least one light source, a detector array and at least one fiber-optic array including a plurality of optical fibers arranged adjacent one another, the fiber-optic array being configured as a fiber-optic plate having an image-input face that faces the scale and an image-output face that faces the detector array;
a light pattern resulting from interaction of beams emitted by the light source with the measuring graduation, the fiber-optic array transmitting the light pattern into a detection plane of the detector array; and
an interstitial medium disposed between the image-output face of the fiber-optic plate and the detector array so as to ensure that an amount of deflection that the beams exiting the image-output face undergo on a path to the detector array is smaller than in a case without the interstitial medium.

US Pat. No. 9,383,184

INDUCTIVE POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An inductive position-measuring device, comprising:
a scanning element; and
a graduation element, the scanning element and the graduation element movable relative to each other in a first direction;
wherein the scanning element includes exciter conductors and three receiver tracks, each receiver track having at least one
receiver conductor, a first receiver track and a second receiver track arranged relative to each other at a distance that
extends orthogonally with respect to the first direction, a third receiver track located between the first receiver track
and the second receiver track;

wherein the graduation element including two graduation tracks arranged relative to each other at a distance that extends
orthogonally with respect to the first direction, and that have different graduation periods along the first direction;

wherein the graduation tracks are adapted to modulate electromagnetic fields generated by the exciter conductors, a relative
position in the first direction detectable by the receiver conductors of the first receiver track and the second receiver
track, and a relative position in a second direction that is oriented orthogonally with respect to the first direction detectable
by the at least one receiver conductor of the third receiver track.

US Pat. No. 9,065,492

PROBE SYSTEM AND METHOD FOR OPERATING A PROBE SYSTEM

DR. JOHANNES HEIDENHAIN G...

1. A probe system, comprising:
a probe having a stylus and a sensor, the sensor adapted to generate a sensor signal in accordance with contact of the stylus;
and

a transmission/reception device;
wherein information is wirelessly transmittable between the probe and the transmission/reception device via a radio signal;
wherein the transmission/reception device or the probe includes two antennas, set apart from each other, adapted to receive
the radio signal;

wherein the transmission/reception device or the probe is adapted to process concurrently the information received by the
two antennas via the radio signal; and

wherein the antennas are adapted to alternately transmit radio signals, so that the radio signal is transmittable by only
one antenna, while the other antenna is mute.

US Pat. No. 9,273,984

DEVICE AND METHOD FOR TRANSMITTING DATA BETWEEN A POSITION-MEASURING DEVICE AND SEQUENTIAL ELECTRONICS

DR. JOHANNES HEIDENHAIN G...

1. A device for transmitting data between a position-measuring device and sequential electronics via a data-transmission channel,
comprising:
an interface unit and a processing unit included in the position-measuring device, the interface unit connected to the data-transmission
channel and to the processing unit for an internal data exchange by a request channel and a response channel, the interface
unit including a command interpreter adapted to convert, in accordance with conversion rules, commands that arrive via the
data-transmission channel into internal requests and to feed via the request channel to the processing unit, the interface
unit adapted to convert response data that arrives from the processing unit via the response channel into output data, the
interface unit including a rules memory adapted to store the conversion rules, the conversion rules in the rules memory being
at least partially modifiable.

US Pat. No. 9,151,593

SYSTEM AND METHOD FOR POSITIONING A PROCESSING TOOL IN RELATION TO A WORKPIECE

DR. JOHANNES HEIDENHAIN G...

1. A system for positioning a processing tool in relation to a workpiece, a workpiece alignment mark being disposed on the
workpiece, comprising:
a first object, an object alignment mark and the workpiece being disposed on the first object;
a second object displaceable along at least one movement direction relative to the first object, the processing tool adapted
to machine and/or inspect the workpiece during a production process, and adapted to detect the object alignment mark, being
disposed on the second object;

an alignment sensor, adapted to detect the object alignment mark and the workpiece alignment mark, disposed on the second
object;

a scannable measuring standard, extending along the at least one movement direction, disposed on the second object; and
at least two scanner units, adapted to scan the measuring standard, disposed on the first object and adapted to determine
a relative position between the first object and the second object along the movement direction, the two scanner units having
a defined offset;

wherein the offset between the two scanner units satisfies:
|dE?dWB|<0.2•|dWB|,

wherein dE represents the offset between the two scanner units and dWB represents a distance between the processing tool and the alignment sensor.

US Pat. No. 9,151,598

POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position measuring device, comprising:
a position detection unit adapted to process positional signals, that result from scanning a code track by a scanning unit,
into digital positional values,

a first interface unit adapted to communicate with a control unit via a data transmission channel; and
a second interface unit adapted to communicate with at least one peripheral unit;
wherein the first interface unit is arranged as a wired interface and the second interface unit is arranged as a wireless
radio interface.

US Pat. No. 9,304,958

DEVICE FOR TRANSMITTING SENSOR DATA

DR. JOHANNES HEIDENHAIN G...

1. A device for transmitting sensor data, comprising:
a first slave interface connectable to a master interface of a control device;
a first master interface connectable to a slave interface of a measuring device;
at least one sensor interface connectable to a sensor; and
a circuit configuration including a manipulation unit and a protocol unit;
wherein the manipulation unit is adapted to receive a master-data input signal of the first master interface and a sensor-data
output signal and to output a slave-data output signal to the first slave interface;

wherein the protocol unit is adapted to receive (a) at least one protocol-relevant interface signal of the first slave interface
or of the first master interface and (b) a sensor-data signal of the sensor interface;

wherein the protocol unit is adapted to generate the sensor-data output signal from the sensor-data signal; and
wherein the protocol unit is adapted to select, based on manipulation rules and the at least one protocol-relevant interface
signal, when the manipulation unit outputs the master-data input signal of the first master interface or the sensor-data output
signal as the slave-data output signal.

US Pat. No. 9,200,927

POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device comprising:
a cylindrical object rotatable about a longitudinal axis and having a circumferential annular reflection measuring graduation;
a stationary scanning unit disposed opposite the cylindrical object and having a light source, a transmission grating and
a detector, the scanning unit being configured to optically scan the reflection measuring graduation by beams of light emitted
from the light source passing through the transmission grating and then striking the reflection measuring graduation, from
where the beams of light are reflected back toward the detector, which is configured to generate rotation-dependent position
signals, wherein an optically effective perpendicular distance between the detector and the reflection measuring graduation
is selected to be one of greater or less than an optically effective perpendicular distance between the transmission grating
and the reflection measuring graduation depending on a radius of the cylindrical object.

US Pat. No. 9,410,797

OPTICAL POSITION-MEASURING DEVICE

Dr. Johannes Heidenhain G...

1. An optical position-measuring device for detecting a position of two objects movable relative to one another, comprising:
a measuring standard connected to one of the two objects;
a scanning system adapted to scan the measuring standard, the scanning system being connected to the other one of the two
objects, the scanning system adapted to permit simultaneous determination of position along a first lateral shift direction
of the objects, along a second lateral shift direction of the objects that is perpendicular to the first lateral shift direction,
and along a vertical shift direction of the objects, the scanning system adapted to form first and second scanning beam paths
to generate a group of phase-shifted signals at an output end from interfering partial beams of rays, the scanning system
adapted to form a third scanning beam path to determine position along the second lateral shift direction;

a light source adapted to supply a beam to the scanning system via a first light guide and coupling-in optics that are common
to all three scanning beam paths; and

coupling-out optics that are common to all three scanning beam paths and that are adapted to couple the interfering partial
beams of rays produced in the three scanning beam paths into a second light guide to supply the interfering partial beams
of rays to a detector system;

wherein the measuring standard includes a cross grating.

US Pat. No. 9,127,922

PROBE AND METHOD FOR OPERATING A PROBE

DR. JOHANNES HEIDENHAIN G...

1. A probe, comprising:
a feeler;
a sensor unit;
a CPU;
a power source adapted to supply energy;
a voltage transformer electrically connected to the power source and adapted to generate a voltage, at an output of the voltage
transformer, higher than an output voltage of the power source;

a device adapted to monitor input power and to control the voltage transformer; and
a charge storage device electrically connected to the output of the voltage transformer, the charge storage device electrically
chargeable by the voltage transformer;

wherein the charge storage device is adapted to deliver an output current pulse at defined intervals to a load;
wherein the load includes a transmitting stage adapted to generate an electromagnetic signal so that ready signals and probe
signals are transmittable by the probe;

wherein the sensor unit is adapted to generate a digital signal in response to deflection of the feeler and to transmit the
digital signal to the CPU, the CPU adapted to process the digital signal and route the processed digital signal to the transmitting
stage, the transmitting stage adapted to generate the probe signal as an electromagnetic ray and/or signal;

wherein the probe is adapted to transmit a ready signal at defined intervals to signal that a measuring-operation mode is
running; and

wherein the device is adapted to ascertain a mean power to be fed to the charge storage for a subsequent time interval, to
control the voltage transformer in accordance with the ascertained mean power to be fed to the charge storage for the subsequent
time interval and a level of a mean input power, to be drawn by the voltage transformer from the power source, the level of
mean input power being specifiable as a function of the ascertained mean power.

US Pat. No. 9,068,811

DEVICE FOR DETERMINING DISTANCE INTERFEROMETRICALLY

DR. JOHANNES HEIDENHAIN G...

1. A device for interferometrically determining a vertical distance between two plates arranged substantially in parallel,
comprising:
a light source;
at least one beam-splitter element;
at least one reflector element;
a plurality of deflection elements;
a plurality of retroreflectors; and
a detection unit;
wherein the light source is adapted to emit a beam of rays that falls in inclined fashion upon a beam-splitter element on
a first plate and is split into a reflected reference beam of rays and a transmitted measuring beam of rays, so that:

the measuring beam of rays strikes a reflector element on a second plate and undergoes a first reflection back in a direction
of the first plate;

the reference beam of rays passes through a first deflection element and the measuring beam of rays passes through a second
deflection element, the reference and measuring beams of rays each subsequently pass through an assigned retroreflector being
arranged separately from the first plate and the second plate, and the measuring beam of rays then traverses a third deflection
element and the reference beam of rays traverses a fourth deflection element, both the first and second deflection elements
and the third and fourth deflection elements in each case producing different deflection effects on the traversing reference
and measuring beams of rays;

the reference beam of rays is then reflected at the first plate;
the measuring beam of rays then undergoes a second reflection back at a reflector element of the second plate; and
the measuring beam of rays and the reference beam of rays then propagate collinearly in a direction of the detection unit,
the detection unit adapted to generate a plurality of phase-shifted distance signals from interfering measuring and reference
beams of rays.

US Pat. No. 9,303,979

OPTICAL POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position measuring device for detecting a relative position of a measuring standard and at least one scanning
head, which are movable relative to each other in at least one measuring direction, wherein an effective measuring point of
the scanning head lies at a defined distance from the measuring standard in a direction that is oriented away from the scanning
head;
wherein a bundle of rays is split into two partial bundles of rays for optical scanning of the measuring standard, and each
of the two partial bundles of rays impinges upon a reflection grating of the measuring standard at least once and is diffracted
by the reflection grating such that a bisecting line between the partial bundle of rays incident on and reflected by the reflection
grating intersects an optical axis in a point that is located on a side of the measuring standard facing away from the scanning
head and represents the effective measuring point.

US Pat. No. 9,261,873

METHOD FOR POSITIONING AXES IN MACHINE TOOLS

DR. JOHANNES HEIDENHAIN G...

1. A method for positioning machine axes of a machine tool, comprising:
converting, by a numerical control device, setpoint positions of a tool, predefined in workpiece coordinates, into setpoint
positions of machine axes based on a kinematic chain defined by a kinematic table, each of the machine axes having a respective
axial direction, transformations of the coordinates being provided in the kinematic table in a plurality of entries describing
the kinematics of the machine tool;

wherein the kinematic table includes at least one first entry that specifies one respective axial direction and one associated
transformation amount; and

wherein the kinematic table includes at least one second entry that specifies an error transformation amount in a first respective
axial direction as a function of an axial position of the machine tool in a second respective axial direction, the first respective
axial direction being different from the second respective axial direction.

US Pat. No. 9,046,386

STRUCTURAL UNIT OF A ROTARY ENCODER, AND METHOD FOR PRODUCING THIS STRUCTURAL UNIT

Dr. Johannes Heidenhain G...

1. A structural unit for a rotary encoder to measure rotary motions about an axis of rotation, comprising:
a graduation carrier made of glass fastened to a mount that includes a recess;
a positioning element fastened to said graduation carrier by a first material connection, wherein said first material connection
is an adhesive connection, which is embodied between said graduation carrier and said positioning element by a first adhesive
that is disposed axially between said graduation carrier and said positioning element, and wherein said positioning element
is disposed in said recess, and said recess is dimensioned such that said recess positions said positioning element in a radial
direction perpendicular to said axis of rotation without play; and

a second material connection is provided between said graduation carrier and said mount, wherein said second material connection
is an adhesive connection radially remote from said axis of rotation and with a second adhesive that is disposed axially between
1) an end face of said mount that extends perpendicular to said axis of rotation and 2) a surface of said graduation carrier
extending parallel to said end face of said mount.

US Pat. No. 9,200,893

POSITION-MEASURING DEVICE AND SYSTEM HAVING A PLURALITY OF POSITION-MEASURING DEVICES

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device for determining a position of an object along a third axis oriented perpendicularly to two
orthogonal, first and second main axes of motion of the object, comprising:
a light source adapted to emit a beam of rays along the first main axis of motion in a direction of the object;
a measuring standard arranged on the object and including graduation markings disposed periodically along the third axis;
at least one reflector arranged along the third axis and set apart from the object;
a retroreflector system; and
a detector system;
wherein position signals with respect to motion of the object along the third axis are generatable from superposition of a
measuring beam and a reference beam produced from the beam of rays.

US Pat. No. 9,127,923

PROBE SYSTEM AND METHOD FOR OPERATING A PROBE SYSTEM

DR. JOHANNES HEIDENHAIN G...

1. A probe system, comprising:
a probe head having a stylus and a sensor element; and
a transceiver element;
wherein the probe head and the transceiver element are adapted to allow a signal communication to be established between the
probe head and the transceiver element in two modes;

wherein, in a first mode, the transceiver element is adapted to transmit a signal receivable by the probe head, and the probe
head is adapted to transmit an acknowledge signal in response to receiving the signal; and

wherein, in a second mode, the sensor element is adapted to generate a sensor signal, when the stylus is touched, transmittable
by the probe head and receivable by the transceiver element, and the transceiver element is adapted to transmit an acknowledge
signal in response to receiving the sensor signal.

US Pat. No. 9,395,176

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device, comprising:
an optical fiber;
a fiber optic scanning head having a scanning reticle disposed therein before a measuring standard end of the optical fiber;
and

a reflection measuring standard movable relative to the fiber optic scanning head in at least one measuring direction,
wherein the optical position-measuring device is configured to generate a plurality of phase-shifted scanning signals regarding
a position of the fiber optic scanning head relative to the reflection measuring standard, the phase-shifted scanning signals
being coded in a wavelength-dependent manner, and

wherein the scanning reticle is configured such that:
a beam incident on the scanning reticle is split into at least two sub-beams which strike the reflection measuring standard
and are subsequently recombined to interfere with each other so as to generate the phase-shifted scanning signals, and

the sub-beams travel different optical path lengths between splitting and recombination,
wherein the scanning reticle is configured as a plate-like transparent substrate, wherein a side of the scanning reticle facing
the optical fiber has a first transmission grating configured to split the beam incident thereon into at least two diffracted
sub-beams which propagate further asymmetrically with respect to a normal to the scanning reticle, and wherein a side of the
scanning reticle facing the reflection measuring standard has a second transmission grating configured to cause the sub-beams
incident thereon from the first transmission grating to be deflected in such a way that the sub-beams propagate symmetrically
relative to each other with respect to the normal to the scanning reticle between the scanning reticle and the reflection
measuring standard and strike the reflection measuring standard at its Littrow angle.

US Pat. No. 9,453,744

MEASURING GRADUATION AND PHOTOELECTRIC POSITION MEASURING DEVICE HAVING THE SAME

DR. JOHANNES HEIDENHAIN G...

1. A measuring graduation for a photoelectric position measuring device for measuring positions in a first direction and in
a second direction extending orthogonally to the first direction, the measuring graduation comprising:
a phase grating having a periodic array of grating elements in the first direction and in the second direction, wherein the
grating elements each have an outer contour that is formed by a continuous line which includes two mutually opposing first
straight edges, two mutually opposing second straight edges extending perpendicularly to the first straight edges, and connecting
lines extending between the first straight edges and the second straight edges, the connecting lines forming an obtuse angle
with the first straight edges and with the second straight edges,

wherein the grating elements each comprise a first area percentage and a second area percentage, the first area percentage
being a reflecting surface area having the outer contour, and the second area percentage being a reflecting surface area surrounding
the first area percentage, and wherein the first area percentage is raised or recessed relative to the second area percentage,
and

wherein the first area percentage and the second area percentage are configured to allow same light intensities to be reflected.

US Pat. No. 9,213,499

METHOD FOR TRANSFERRING DATA BETWEEN A POSITION-MEASURING DEVICE AND AN ASSOCIATED PROCESSING UNIT AND POSITION-MEASURING DEVICE THEREFOR

DR. JOHANNES HEIDENHAIN G...

1. A method for transferring data between a position-measuring device and an associated processing unit, the method comprising:
transferring first data having a first priority in successive cycles from the position-measuring device to the processing
unit, the successive cycles being in each case initiated by a request command by the processing unit requesting the first
data from the position-measuring device;

transferring second data having a second, lower priority from the position-measuring device to the processing unit in at least
a portion of the successive cycles with the first data, wherein types of the second data being transferred in a respective
one of the successive cycles are variable;

assigning at least one particular type, of the types of the second data to be transferred, to individual cycles of the successive
cycles using information stored in the position-measuring device without involvement of the processing unit; and

defining sequences of the second data, for use in the assigning, in an order defined by at least one transmission list stored
in a memory of the position-measuring device.

US Pat. No. 9,106,169

CONTROLLER STRUCTURE FOR MULTIPLE MECHANICALLY COUPLED DRIVE UNITS

DR. JOHANNES HEIDENHAIN G...

1. A controller structure for a plurality of drive units mechanically coupled to a movable element, comprising:
a single position measuring device configured to determine an actual position of the movable element; and
a position controller configured to calculate a setpoint speed valid for all drive units from a setpoint position and the
actual position;

wherein the position measuring device and the position controller are configured to jointly serve all of the drive units,
each drive unit including a speed controller;

wherein one drive unit is configured as a higher-order master, and each drive units subordinated to the master is configured
as a slave and includes an MMS controller configured to provide a speed correction value for the master and the slave; and

wherein the plurality of drive units are mechanically coupled to the movable element and are configured to simultaneously
advance the movable element in one direction.

US Pat. No. 9,482,517

OPTICAL POSITION-MEASURING DEVICE

Dr. Johannes Heidenhain G...

1. An optical position-measuring device, comprising;
a measuring standard;
a scanning unit movable relative to the measuring standard along at least one measuring direction, a scanning beam path being
formed between the measuring standard and scanning unit; and

a protective cap movable along an axis perpendicular to a measuring-standard plane such that in at least one operating mode,
the protective cap surrounds the scanning beam path between the scanning unit and measuring standard at least in a spatial
area in which the scanning beam path is sensitive to variations in refractive index.

US Pat. No. 9,127,924

INTERFEROMETER

DR. JOHANNES HEIDENHAIN G...

1. An interferometer, comprising
a light source;
a beam splitter adapted to split a first beam of rays, emitted by the light source, into at least one measuring beam and at
least one reference beam, to define a first splitting plane, such that the measuring beam propagates in a measuring arm and
the reference beam propagates in a reference arm until being recombined at a recombining location in a first recombining plane,
the first recombining plane being oriented parallel to the first splitting plane;

a measuring reflector arranged in the measuring arm and joined to an object to be measured that is movable along a measuring
direction, the measuring reflector being arranged such that the measuring beam falls perpendicularly on the measuring reflector
at least twice;

a reference retroreflector being arranged in the reference arm, such that the reference beam falls on the reference retroreflector
at least once;

a detector system adapted to ascertain at least a first distance signal regarding a position of the object to be measured
from the interfering measuring and reference beams superposed at the recombining location;

a first transparent plane plate and a second transparent plane plate arranged parallel to each other in the beam path between
the light source and the detector system, the measuring reflector being movable along the measuring direction relative to
the two plane plates;

wherein the reference retroreflector is arranged in the first plane plate; and
wherein the beam splitter is arranged on the second plane plate.

US Pat. No. 9,310,183

MEASURING DEVICE FOR HIGH-PRECISION OPTICAL DETERMINATION OF DISTANCE OR POSITION

DR. JOHANNES HEIDENHAIN G...

1. A measuring device for high-precision optical determination of distance and/or position, comprising:
a light source;
at least one optical functional element arranged as a plane mirror;
two imaging elements; and
a detector system;
wherein the optical functional element is adapted such that at least one of at least two sub-beams impinges on the optical
functional element three times before the sub-beams propagate, interferingly superposed, in a direction of the detector system,
the detector system adapted to generate at least one phase-encoded measuring signal from the superposed sub-beams;

wherein between the impingements on the optical functional element, the sub-beam passes through the imaging elements, the
imaging elements having imaging factors such that no location and directional shear of the interfering sub-beams results if
the optical functional element tilts out of a setpoint position;

wherein the imaging elements are adapted to displace emergent sub-beams relative to incident beams of rays;
wherein for the imaging factors of a number of N imaging elements, the following conditions are satisfied:
N=2,m1=?2, and m2=?½; and

wherein n=1 . . . N and mn represents an imaging factor of an nth imaging element.

US Pat. No. 9,062,956

PROBE HEAD

DR. JOHANNES HEIDENHAIN G...

1. A probe head, comprising
a stylus; and
a housing including a first housing unit and a second housing unit movably supported on the first housing unit, the first
housing unit having a longitudinal axis and adapted to be affixed on a machine, the stylus deflectably supported on the second
housing unit;

a sensor unit adapted to output an electrical signal in response to a deflection of the stylus relative to the second housing
unit; and

a switching unit including a first contact element and a second contact element, the contact elements adapted to be brought
into mutual contact at different contact points as a function of a direction of deflection of the second housing unit relative
to the first housing unit, to trigger an electrical switching signal.

US Pat. No. 9,835,656

METHOD AND DEVICE FOR MEASURING CURRENT AT A CONVERTER

DR. JOHANNES HEIDENHAIN G...

12. A device for measuring current at a converter in order to operate a closed-loop control device, assigned to the converter,
based on measured phase currents, comprising:
at least two current-measurement devices, connected downstream of a respective common phase output of the converter, adapted
to simultaneously measure associated phase current independently of each other, so that the measuring results of both current-measurement
devices are utilized to determine the prevailing phase current;

wherein each current measurement device is adapted to measure electrical current in at least two predefined current-measurement
ranges;

wherein a measuring range of each of the current-measurement devices is adjustable during measuring operation by switching
the measuring range between the at least two predefined current-measurement ranges; and

and wherein the current-measuring devices that measure the phase current at the common phase output of the converter are adapted
to repeatedly switch between the predefined current-measurement ranges, so that while the measuring range of one current-measurement
device is being switched over, at least one other current-measurement device continues to measure the phase current.

US Pat. No. 9,395,214

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device, comprising:
a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark;
a scanner displaceable relative to the measuring standard in a measuring direction, the scanning unit having at least one
second grating disposed at a scanning distance from the first grating;

a first detector array configured to obtain a first scanning signal for purposes of position determination in which the gratings
are illuminated with light of a first wavelength; and

a second detector array configured to obtain a second scanning signal for purposes of position determination in which the
absolute mark is illuminated with light of a second wavelength, the first wavelength being shorter than the second wavelength.

US Pat. No. 9,431,936

METHOD FOR DIAGNOSING A FREQUENCY CONVERTER

DR. JOHANNES HEIDENHAIN G...

1. A method for diagnosing a frequency converter, the frequency converter having a positive and negative DC link voltage which
is applied via bridges of switching elements in an alternating sequence to phases of a motor, wherein pulse width modulation
(PWM) signals drive the switching elements for a respective one of the phases, and wherein current sensors capture phase currents,
the method comprising:
a) applying PWM signals as test patterns to the switching elements;
b) picking up sensor signals of the current sensors; and
c) ascertaining a presence of the DC link voltage upon a displacement current being recognized in the sensor signals at each
of the flanks of the PWM signals applied as the test patterns, the displacement current being recognized by detecting discrete
current spikes occurring in the sensor signals and determining whether each respective one of the current spikes temporally
coincides with each respective one of the flanks of the test patterns.

US Pat. No. 9,400,168

DEVICE FOR DISTANCE MEASUREMENT

DR. JOHANNES HEIDENHAIN G...

1. A device for interferential distance measurement, comprising:
a measurement reflector comprising a single surface;
a light source emitting a beam parallel to said surface;
a splitter element comprising a splitter grating that is disposed perpendicular to said surface, wherein said splitter grating
receives said beam and splits said beam into a measurement beam and a reference beam, wherein said measurement beam reflects
acting at least twice upon said single surface of said measurement reflector along a path of said measurement beam;

a combining element, at which said measurement beam and said reference beam enter into interferential superposition to form
interfering measurement and reference beams; and

a detector arrangement, by way of which a plurality of phase-shifted, periodic scanning signals pertaining to a distance between
said measurement reflector and a component of said device in a measuring direction are generated from said interfering measurement
and reference beams.

US Pat. No. 9,081,377

CLOSED-LOOP CONTROL STRUCTURE FOR DAMPING LOW-FREQUENCY VIBRATIONS

DR. JOHANNES HEIDENHAIN G...

1. A closed-loop control structure for positioning a load with the aid of an electric motor, comprising:
an arrangement adapted to actively damp unwanted, low-frequency vibrations;
a position controller adapted to receive a deviation of an actual position of the load from a setpoint position and to output
a setpoint speed;

a speed controller adapted to receive a deviation of an actual speed of the load from the setpoint speed and to output a setpoint
current;

a current controller adapted to receive a deviation of an actual current of the motor from the setpoint current and to output
a setpoint voltage for operating the motor;

wherein damping signals adapted to counteract unwanted, low-frequency vibrations are injectable in the control loop;
wherein a first damping signal and a second damping signal of different phase angle are derivable from a single sensor signal;
wherein the first damping signal is injectable between the position controller and the speed controller; and
wherein the second damping signal is injectable between the speed controller and the current controller.

US Pat. No. 9,404,769

ANGULAR-POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An angular-position measuring device, comprising:
a body;
a roller bearing;
a shaft rotatable relative to the body, via the roller bearing, about an axis extending in a z-direction; and
a measuring standard, having an end face, fastened on the shaft in rotatably fixed manner;
wherein the body includes a scanning device adapted to scan the measuring standard;
wherein both the roller bearing and a sealing unit are arranged on a side of the measuring standard that faces the end face
relative to the z-direction; and

wherein the sealing unit includes rings rotatable relative to each other and separated from each other by a gap, the gap being
at least partially filled with a fluid.

US Pat. No. 9,389,100

OPTICAL POSITION MEASURING INSTRUMENT

DR. JOHANNES HEIDENHAIN G...

1. An optical position measuring instrument, comprising:
a first scale comprising a first graduation, wherein said first scale is disposed movable in a first measuring direction,
and, at a certain position, said first scale comprises a first marking that is finite in size, differs from said first graduation,
and indicates a first defined position of said scale in space and along said first measuring direction; and

a second scale comprising a second graduation, wherein said second scale is disposed movable in a second measuring direction,
and, at a second defined position of a portion of said second scale, said second scale comprises a reference marking that
has a structure that generates at least one reference signal at a reference position of said second scale only if said first
scale is located in said first defined position.

US Pat. No. 9,849,555

MACHINE TOOL

DR. JOHANNES HEIDENHAIN G...

1. A machine tool, comprising
a stationary machine frame;
a tool head positionable relative to the machine frame along three translation axes oriented orthogonally with respect to
each other, the tool head including a motor-driven tool;

a swivel unit pivotable about a horizontal swivel axis relative to the machine frame and including a workpiece positioning
device adapted to rotate a workpiece about an axis of rotation oriented perpendicularly to the swivel axis;

a first measuring system;
a second measuring system; and
a measuring frame assigned to the swivel unit, the measuring frame rotatable with the swivel unit and thermally and/or mechanically
decoupled from the swivel unit, components of the first measuring system and the second measuring system being provided on
the measuring frame;

wherein additional components of the first position measuring system are arranged on the tool head, and further components
of the second position measuring system are provided on the workpiece positioning device;

wherein the first position measuring system is adapted to measure a spatial position of the tool head relative to the measuring
frame; and

wherein the second position measuring system is adapted to measure a spatial position of the workpiece positioning device
relative to the measuring frame.

US Pat. No. 9,303,980

SYSTEM FOR POSITIONING A TOOL RELATIVE TO A WORKPIECE

DR. JOHANNES HEIDENHAIN G...

1. A system for positioning a tool relative to a workpiece, comprising:
a movable table adapted to accommodate a workpiece and to execute movements in first and second main moving directions during
processing of the workpiece;

at least one planar measuring standard arranged stationary about the tool and extending in a plane of the main moving directions;
and

scanning heads, mounted in at least three corners of the table, adapted to detect a position of the table relative to the
measuring standards, in six degrees of freedom, in at least one of the corners, at least one scanning head having a total
of at least three measuring axes being provided for 3-D position detection in three independent spatial directions;

wherein sensitivity vectors of the measuring axes for the 3-D position detection are arranged neither parallel to a first
plane defined by the first main moving direction and a direction orthogonal to the first and second main moving directions
nor parallel to a second plane defined by the second main moving direction and the direction orthogonal to the first and second
main moving directions.

US Pat. No. 9,303,981

POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device, comprising:
a scale having a measuring graduation, at least one reference mark and area markings located on a first and on a second side
of the at least one reference mark which are configured to exert different deflection effects on a scanning beam incident
on the area markings, the measuring graduation being optically scannable such that periodic measurement signals are generatable
by optically scanning the measuring graduation, the at least one reference mark being optically scannable such that a reference
signal is generatable by optically scanning the reference mark and the area markings being optically scannable such that an
area signal is generatable by optically scanning the area markings with the scanning beam,

an area signal detector configured to detect, during optical scanning of the area markings, a fringe pattern in a detection
plane of the area signal detector,

a scanning unit movable relative to the scale in a measurement direction, the area signal being usable to distinguish whether
the scanning unit is located on the first or on the second side of the reference mark, and

a periodic screen grating disposed between the scale and the area signal detector and configured to produce the fringe pattern
in the detection plane of the area signal detector such that at least two distinguishable scanning signals are generatable
from the fringe pattern as a function of a position of the scanning unit relative to the at least one reference mark.

US Pat. No. 9,140,580

METHOD AND APPARATUS FOR ANGLE MEASUREMENT

DR. JOHANNES HEIDENHAIN G...

1. An apparatus for angle measurement in the form of an angle measurement device, the apparatus comprising:
a graduation carrier comprising a code track disposed concentrically to a center point of said graduation carrier;
a first scanning unit comprising a first interface;
a second scanning unit comprising a second interface, wherein said first scanning unit and said second scanning unit ascertain
angle values of said graduation carrier by scanning said code track; and

a control unit comprising:
a device interface that is in communication with a follower electronics unit;
a control unit interface that is in communication with said first interface and said second interface; and
a processing unit by which, via said control unit interface and a request for angle values, angle values of said first scanning
unit and said second scanning unit can be requested and processed into a corrected angle value, and said corrected angle value
can be transmitted to said follower electronics unit via said device interface.

US Pat. No. 9,835,476

SCANNING ELEMENT FOR AN INDUCTIVE ANGLE-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A scanning element for an inductive angle-measuring device, comprising:
a printed circuit board having exciter lines and receiver lines;
an electronic circuit; and
a housing, the printed circuit board being arranged within the housing, the housing having a guideway, the printed circuit
board being inserted into the guideway and positioned with form locking in a direction parallel to an axis, the printed circuit
board being deformed, in response to being inserted into the guideway, along a circle line that is curved about the axis;

wherein the housing includes a circular side wall that extends parallel to the axis, the housing including a circumferential
opening in the side wall and in the guideway, the printed-circuit board insertable through the circumferential opening in
a tangential direction into the guideway, the guideway engaging at least one longitudinal edge of the printed-circuit board
during the tangential insertion of the printed-circuit board through the opening into the guideway.

US Pat. No. 9,835,480

MULTITURN ROTARY ENCODER

DR. JOHANNES HEIDENHAIN G...

1. A multiturn rotary encoder, comprising:
a single-turn unit, including a code carrier scannable by a single-turn scanner in order to generate single-turn position
signals, and a single-turn evaluation unit adapted to process the single-turn position signals to form at least one single-turn
code word that indicates an absolute position of an input shaft within one revolution;

a first multiturn unit, operable dependent on a supply of power from of a power supply of the multiturn rotary encoder, including
at least a first multiturn code carrier scannable by a first multiturn scanner in order to generate first multiturn position
signals, and a first multiturn evaluation unit adapted to process the first multiturn position signals to form a first multiturn
code word that indicates a number of revolutions executed by the input shaft; and

a second multiturn unit, operable independent of the supply of power from the power supply, including at least a second multiturn
code carrier scannable by a second multiturn scanner in order to generate second multiturn position signals, and a second
multiturn evaluation unit adapted to process the second multiturn position signals to form a second multiturn code word which
also indicates the number of revolutions executed by the input shaft;

wherein a value of the first multiturn code word of the first multiturn unit in an initialization phase responsive to the
power supply of the multiturn rotary encoder being switched on is referenced with a value of the second multiturn code word.

US Pat. No. 9,534,586

DEVICE FOR MEASURING DEFORMATIONS OF A ROTOR BLADE AND METHOD FOR INSTALLING SUCH A DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A device for measuring deformations of a rotor blade of a wind turbine generator system, the device comprising:
a position-measuring device having a first assembly and a second assembly, the first assembly being disposed so as to be rotatable
relative to the second assembly about an axis, the position-measuring device being configured to measure a relative angular
position between the first and second assemblies;

an arm mechanically coupled to the first assembly and having a first adhesive bonding surface configured to allow the arm
to be permanently joined to the rotor blade at the first adhesive bonding surface, the second assembly having a second adhesive
bonding surface configured to allow the second assembly to be permanently joined to the rotor blade, the first adhesive bonding
surface being disposed at a distance (X) from the second adhesive bonding surface in a direction of extension of the arm,
the arm being mechanically coupled to the first assembly at a radial distance such that a relative angular displacement is
producible between the first and second assemblies in response to a change in the distance (X);

a first mounting element fixed to at least one of the second assembly and the arm; and
a second mounting element that is adhesively attachable to the rotor blade, the first mounting element being detachably joinable
to the second mounting element.

US Pat. No. 9,395,215

LINEAR ENCODER AND METHOD OF ADJUSTING A GAP BETWEEN A SENSOR UNIT AND A SCALE OF THE LINEAR ENCODER

DR. JOHANNES HEIDENHAIN G...

1. A linear encoder, comprising:
a housing;
a scale disposed within the housing;
a sensor unit disposed within the housing facing the scale with a gap between the sensor unit and the scale, the sensor unit
being configured to scan the scale and obtain position information;

at least one adjustment hole for a gap adjustment disposed in at least one of the housing and an end cover of the housing
at a position corresponding to a position of the gap; and

a removable cover on the at least one adjustment hole,
wherein the at least one adjustment hole is configured such that a gap gauge is insertable into the gap between the scale
and the sensor unit through the at least one adjustment hole when the cover is removed.

US Pat. No. 9,303,972

POSITION-MEASURING DEVICE AND METHOD FOR OPERATING THE SAME

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device, comprising:
a code carrier having at least a first graduation track and a second graduation track, the second graduation track being an
incremental graduation track;

a first detector system configured to scan the first graduation track and the second graduation track so as to generate first
position signals;

a second detector system configured to scan the second graduation track so as to generate second position signals;
a first position-processing unit configured to process the first position signals so as to yield a first absolute position
value; and

a second position-processing unit configured to process the second position signals so as to yield a second absolute position
value, the first position-processing unit being configured to feed an absolute auxiliary position value to the second position-processing
unit and the second position-processing unit being initializable with the absolute auxiliary position value.

US Pat. No. 9,212,893

ABSOLUTE POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An absolute position-measuring device, comprising:
a first subassembly having a measuring standard on which at least one code track is disposed, and a scanning unit adapted
to scan the code track in a measuring direction to produce position signals for generating an absolute digital position; and

a second subassembly having at least one peripheral unit adapted to perform an additional and/or an auxiliary function of
the position-measuring device;

wherein the first subassembly and the second subassembly are connected to each other by a plurality of electric lines to transmit
electrical signals;

wherein the first subassembly exclusively includes components adapted for use in a radiation area of a machine; and
wherein the second subassembly includes components unsuitable for use in the radiation area of the machine.

US Pat. No. 9,627,898

DEVICE AND METHOD FOR TRANSMITTING ENERGY AND DATA BETWEEN A CONTROL UNIT AND A POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A device for transmitting energy between a control unit and a position-measuring device via a line pair in a charge mode
and for transmitting data between the control unit and the position-measuring device via the line pair in a communication
mode, comprising:
an energy storage device arranged in the position-measuring device, the energy storage device being chargeable by the line
pair in the charge mode and adapted to supply energy to the position-measuring device in the communication mode;

a charge unit arranged in the control unit; and
a switching device arranged in the control unit and adapted to connect the charge unit to the line pair in a two-pole manner
in the charge mode.

US Pat. No. 9,638,514

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for sensing a relative position of two objects that are movable relative to one another,
the optical position-measuring device comprising:
a reflection material measure connected to a first one of the two objects; and
a scanning unit connected to a second one of the two objects, the scanning unit being configured to provide relative position
information using interfering superposition of at least two pairs of sub-beams, the scanning unit comprising a light source,
a first and a second splitting element, deflecting elements and a first, a second, a third and a fourth detector, which are
disposed in the scanning unit such that:

a beam incident from the light source is split into at least a first, a second, and a third sub-beam in a first splitting
plane by the first splitting element,

the first and third sub-beams are deflected toward the reflection material measure by the deflecting elements, while the second
sub-beam is split into at least a fourth and a fifth sub-beam by the second splitting element, the first and fourth sub-beams
propagating toward a first point of incidence as a first pair of superimposed sub-beams, and the third and fifth sub-beams
propagating toward a second point of incidence on the reflection material measure as a second pair of superimposed sub-beams,
and

the first and second pairs of superimposed sub-beams, after being reflected by the reflection material measure, propagate
respectively toward the first and the second detector, where the sub-beams in each pair are brought into interfering superposition,
so that the detectors detect first and second displacement-dependent scanning signals from which, in turn, position information
regarding a vertical and a first lateral direction of displacement of the objects is derived, the first lateral direction
of displacement extending in the first splitting plane or parallel thereto, wherein the incident beam is additionally split
by the first splitting element in the scanning unit into further sub-beams in a second splitting plane which is oriented perpendicular
to the first splitting plane, and wherein the sub-beams propagate in the second splitting plane in a manner analogous to the
sub-beams in the first splitting plane, so that third and fourth displacement-dependent scanning signals are respectively
detected by the third and the fourth detectors, and position information regarding the vertical direction of displacement
and a second lateral direction of displacement of the objects is derived from the third and the fourth scanning signals, the
second lateral direction of displacement extending in the second splitting plane or parallel thereto.

US Pat. No. 9,847,741

CIRCUIT ARRANGEMENT FOR AN ELECTROMAGNETIC HOLDING BRAKE

DR. JOHANNES HEIDENHAIN G...

1. A circuit arrangement for supplying an electromagnetic holding brake of an electric motor with an operating voltage from
a higher-level control system disposed separately from the motor and the holding brake that releases the holding brake, and
for supplying a holding voltage that is reduced relative to the operating voltage and holds the holding brake in the released
position, the circuit arrangement comprising:
a switching element connected to a terminal of the holding brake by which the operating voltage is applied to the holding
brake;

a voltage divider connected to receive and adjust a voltage tapped from the terminal of the holding brake relative to a reference
voltage that is derived from an upper potential of the operating voltage;

a comparator having a first input connected to receive the reference voltage, a second input connected to receive the voltage
tapped from the terminal of the holding brake that was adjusted by the voltage divider and an output connected with the switching
element, the comparator being configured to determine that the voltage at the second input has fallen below the reference
voltage at the first input and to output a pulse-width modulated signal which operates the switching element in a pulsed mode
so as to produce, on average, the holding voltage; and

a starting capacitor connected with the second input of the comparator and dimensioned such that the pulse-width modulated
signal is not emitted at the output of the comparator for an amount of time sufficient to initially apply the operating voltage
to release the holding brake.

US Pat. No. 9,797,704

INTERFEROMETER HAVING TWO TRANSPARENT PLATES IN PARALLEL FOR MAKING REFERENCE AND MEASUREMENT BEAMS PARALLEL

DR. JOHANNES HEIDENHAIN G...

1. An interferometer, comprising
a light source adapted to emit a beam of rays;
a first beam splitter adapted to split the beam of rays, emitted by the light source, into at least one measuring beam and
at least one reference beam, to define a splitting plane, the measuring beam adapted to propagate in a measuring arm and the
reference beam adapted to propagate in a reference arm until being recombined at a recombining location in a recombining plane,
the recombining plane being oriented parallel to the splitting plane;

a reference reflector arranged in the reference arm so that the reference beam impinges at least three times on the reference
reflector;

a measuring reflector arranged in the measuring arm and adapted to be joined to an object to be measured, that is movable
along a measuring direction relative to the reference reflector, so that the measuring beam impinges at least three times
on the measuring reflector;

a detection unit adapted to ascertain at least one distance signal with regard to a position of the object to be measured
from interfering measuring and reference beams superposed at the recombining location;

at least two transparent plane-parallel plates arranged parallel to each other in the beam path between the light source and
the detection unit, the first beam splitter being integrated in one of the plane parallel plates, at least the measuring reflector
being movable relative to the plane-parallel plates along the measuring direction, each plane-parallel plate including a plurality
of optical elements adapted to impart an optical effect on the measuring beam and the reference beam such that the measuring
beam and the reference beam propagate parallel between (a) the plane-parallel plate that is located adjacent to the reference
and measuring reflectors and (b) the reference and measuring reflectors;

wherein the optical elements in the two plane-parallel plates include a plurality of reflectors and at least four imaging
optical systems for the measuring beam and the reference beam;

wherein two imaging optical systems in each case are adapted to displace the measuring beam and the reference beam from the
splitting plane to an intermediate plane that is located between, and oriented parallel to, the splitting plane and the recombining
plane; and

wherein two further imaging optical systems in each case are adapted to displace the measuring beam and the reference beam
from the intermediate plane to the recombining plane.

US Pat. No. 9,614,663

METHOD AND DEVICE FOR SERIAL DATA TRANSMISSION OVER A BIDIRECTIONAL DATA CHANNEL

DR. JOHANNES HEIDENHAIN G...

1. A method for serial data transmission between a position-measuring device and subsequent electronics over a bidirectional
data channel, the method comprising:
transmitting data in data frames and in encoded form in accordance with a data transmission code, the data transmission in
each case being initiated by an interface unit at a transmitter end with a start sequence having an encoding scheme that at
least partially differs from an encoding scheme of a remainder of the data frames; and

after a reversal of data direction, detecting, by an interface unit at a receiver end, a beginning of the data transmission
in each case by detection of the start sequence,

wherein the interface units at the receiver and transmitter ends each include a read unit and the read units each include
a synchronization unit to which a data stream arriving over the data channel is delivered and which synchronizes the data
stream with a clock signal, wherein the encoding scheme of the remainder of the data frames is a Manchester encoding scheme
in which the data stream for transmitting the data frames contains a sequence of short symbols and long symbols and, in case
of regular encoding, there is always an even number of successive short symbols in the data stream, and wherein the read units
each include a symbol discriminator to which the synchronized data stream is fed by a respective one of the synchronization
units and which determines the sequence of short symbols and long symbols in the synchronized data stream and transmits only
the determined sequence to a respective decoding unit for decoding.

US Pat. No. 9,823,058

DEVICE FOR POSITION DETERMINATION

DR. JOHANNES HEIDENHAIN G...

1. A device for position determination comprising:
a light source;
a planar measurement reflector movable along at least one measurement direction which is oriented perpendicular to the measurement
reflector;

a detector device disposed such that at least one beam emitted by the light source strikes the detector device after impinging
on the measurement reflector so that, in an event of a movement of the measurement reflector along the at least one measurement
direction, at least one signal results which is dependent on a position of the measurement reflector and from which a reference
signal is generatable at a defined reference position; and

a deflection unit disposed so as to deflect the at least one beam such that the at least one beam strikes the measurement
reflector twice, and, in between a first and a second reflection from the measurement reflector, passes through the deflection
unit, the deflection unit being arranged so that a deviation in beam direction, resulting after the first reflection from
a tilt of the measurement reflector by an angle ? about a tilt axis, is compensated after the second reflection using one
or more optical components that are designed such that a beam impinging a first time at an angle ? to a normal to the measurement
reflector in a non-tilted state will impinge a second time on the measurement reflector at an angle ??2? to the normal to
the measurement reflector in the non-tilted state after it has passed through the deflection unit, wherein a first transmission
grating is arranged between the light source and the deflection unit, and a second transmission grating is arranged between
the deflection unit and the detector device along a path of the at least one beam.

US Pat. No. 9,667,172

INVERTER

DR. JOHANNES HEIDENHAIN G...

1. A multiphase inverter for selectively feeding effective and reactive power into a power grid having a plurality of phases,
comprising:
a plurality of circuits, each circuit corresponding to a respective phase of each and every one of the plurality of phases
of the power grid, each circuit of the plurality of circuits including:

two series-connected intermediate circuit capacitors, a joint connection of which defines a median voltage level between a
positive voltage level and a negative voltage level;

first, second, third, and fourth semiconductor switches including parallel-connected free-wheeling diodes, located serially
in sequence between the positive voltage level and the negative voltage level, a joint connection of the second semiconductor
switch and the third semiconductor switch connectable via a choke to the power grid;

series-connected first and second diodes, a joint connection of which is at the median voltage level, a second connection
of the series-connected first and second diodes connected to a joint connection of the first semiconductor switch and the
second semiconductor switch, a third connection of the series-connected first and second diodes connected to a joint connection
of the third semiconductor switch and the fourth semiconductor switch;

additional semiconductor switches; and
additional chokes connected to joint connections of two of the first to fourth semiconductor switches to form, in accordance
with the additional semiconductor switches, switchable paths to accept free-wheeling currents, the additional chokes including
(a) a first additional choke connected to a joint connection of the first and second semiconductor switches, (b) a second
additional choke connected to a joint connection of the second and third semiconductor switches, and (c) a third additional
choke connected to a joint connection of the third and fourth semiconductor switches.

US Pat. No. 9,664,502

INTERFERENTIAL POSITION-MEASURING DEVICE AND METHOD FOR OPERATING AN INTERFERENTIAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An interferential position-measuring device for determining a position of an object which is disposed to be movable along
at least one measurement direction, the device comprising:
a light source configured to emit a beam which is split into at least two sub-beams, at least one of the sub-beams impinging
on one or more optical functional elements on the object, the sub-beams subsequently being superimposed and interfered at
a superposition location and at least one resulting signal beam propagating toward an evaluation unit configured to generate
at least one position-dependent measurement signal from the at least one resulting signal beam; and

at least one switching element disposed in the signal path downstream of the superposition location and upstream of a signal-digitizing
device, the at least one switching element being configured to define a specific point in time at which sampling occurs.

US Pat. No. 9,733,068

OPTICAL POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position measuring device, comprising:
a splitting grating adapted to split an illumination beam bundle emitted by a light source into at least two partial beam
bundles;

a combination grating adapted to recombine the partial beam bundles, so that a plurality of phase-displaced, displacement-dependent
scanning signals is generatable from the resulting signal beam bundle, no polarization-optical components being located in
scanning beam paths of the partial beam bundles between the splitting grating and the combination grating;

wherein, in order to attain different polarization-optical effects on the partial beam bundles when passing through the scanning
beam paths:

a conically incident illumination beam bundle impinges upon the splitting grating, the incident illumination beam bundle extending
in a plane of incidence perpendicular to the measuring direction at an angle other than 0°, and the plane of incidence defined
by a grating normal to the splitting grating and a direction of incidence of the illumination beam bundle; and

the scanning beam paths of the partial beam bundles are formed in mirror symmetry with respect to the plane of incidence;
and

wherein the optical position measuring device is adapted to detect a relative position of a first measuring standard and a
second measuring standard, movable relative to each other along at least one measuring direction.

US Pat. No. 9,810,554

POSITION MEASURING INSTRUMENT

DR. JOHANNES HEIDENHAIN G...

1. A position measuring instrument, comprising:
a code carrier comprising:
a first code track comprising a first series of consecutive and uninterrupted code elements, wherein each of said consecutive
and uninterrupted code elements of said first series of code elements consists essentially of two subregions with associated
complementary properties, which are disposed in succession in a measuring direction; and

a second code track extending parallel to said first code track and comprising a second series of code elements that is identical
to said first series of consecutive and uninterrupted code elements, wherein said first series of consecutive and uninterrupted
code elements and said second series of code elements each define identical code information, wherein said second series of
code elements of said second code track is displaced, relative to said first series of consecutive and uninterrupted code
elements of said first code track, in said measuring direction on said code carrier in such a way that said consecutive and
uninterrupted code elements of said first code track and said code elements of said second code track that form a code word
overlap one another at least partially, and wherein said second series of code elements of said second code track are displaced
by an amount V=N/2+K/2 code elements relative to said first series of consecutive and uninterrupted code elements of said
first code track;

a scanning unit comprising a plurality of detectors for scanning code elements of said first code track and said second code
track, wherein said plurality of detectors form a corresponding scanning signal from each of said two subregions of said scanned
code elements; and

an evaluation unit comprising a structure for generating one item of code information in the form of a Bit from said corresponding
scanning signal formed from each of said two subregions of each of said scanned code elements, and for forming said code word
from said Bits which defines an absolute position in said measuring direction, wherein said code word is composed of N Bits
from successive code elements of said first code track and K Bits from successive code elements of said second code track,
with N and K being greater than 1.

US Pat. No. 9,671,701

XY-TABLE

DR. JOHANNES HEIDENHAIN G...

7. An XY-table, comprising:
a table;
a first drive adapted to move the table in at least one degree of freedom; and
a separate drive, separate from the first drive, adapted to reverse a direction of movement of the table, the separate drive
including:

a ferromagnetic rib that projects at an edge of the table and extends perpendicular to the direction of movement of the table;
a magnetic yoke adapted to receive the rib at least when the table is at a reversing point, free ends of the magnetic yoke
having pole shoes adapted to concentrate a magnetic flux in the yoke in an air gap, the rib adapted to travel into an interior
of the yoke through the air gap; and

a reversal coil adapted to generate the magnetic flux.

US Pat. No. 9,835,430

POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device, comprising:
a first assembly having a profiled element that bears a scale having a first measuring graduation and a second measuring graduation,
the first assembly being installable on a first object to be measured;

a second assembly having a first scanning unit that is movable along a travel path in a measuring direction so as to scan
the first measuring graduation, the second assembly being installable on a second object to be measured such that a position
of the first object relative to the second object is measurable; and

at least one second scanning unit mounted on the profiled element so as to enable the second measuring graduation to be scanned,
the at least one second scanning unit being positioned in a way that allows the first scanning unit to traverse collision-free
along the travel path at a distance spaced apart from the at least one second scanning unit orthogonally to the measuring
direction such that a displacement of the scale relative to the first object is measurable.

US Pat. No. 9,618,368

POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device, comprising:
a scale having an incremental measuring graduation and a plurality of reference marks spaced apart from each other in a measurement
direction, a reference mark pulse being generatable by scanning one of the reference marks, the scale having a first marking
track containing a first marking associated with one of the reference marks and a second marking spaced apart from the first
marking in the measurement direction, the second marking being longer than the first marking in the measurement direction,
a switching signal being generatable by scanning the second marking; and

a scanning unit movable relative to the scale in the measurement direction, the scanning unit having, for purposes of scanning
the first marking track, a first detector and a second detector spaced apart from the first detector in the measurement direction,
a distance between the first detector and the second detector being greater than a length of the first marking and less than
a length of the second marking, each of the detectors being configured to generate a scanning signal in response to scanning
one of the markings, the scanning unit being configured to produce the reference pulse based on only the first detector of
the two detectors generating a scanning signal, and to produce the switching signal when both the first detector and the second
detector generate a scanning signal.

US Pat. No. 9,733,069

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for detecting the position of two objects movable relative to each other, comprising:
a measuring standard joined to one of the two objects and including a measuring graduation having a periodic arrangement of
graduation regions along at least a first graduation direction; and

a scanning unit including a plurality of optical elements and being movable relative to the measuring standard, arrangement
and formation of the optical elements of the scanning unit adapted to produce a scanning beam path in which partial beams
of rays reaching interference propagate in mirror symmetry in relation to a plane of symmetry and either fall in V-shaped
fashion on the measuring standard and/or are reflected back in a V-shape by the measuring standard;

wherein the plane of symmetry is tilted by a defined tilt angle about an axis of rotation oriented parallel to a surface of
the measuring standard and extends in a direction perpendicular to the first graduation direction; and

wherein a graduation period of the measuring graduation and the tilt angle are selected such that the scanning beam path in
the scanning unit is identical to the scanning beam path in an untilted state, in which the plane of symmetry is oriented
perpendicular to the surface of the measuring standard.

US Pat. No. 9,605,658

DEVICE FOR MEASURING DEFORMATIONS OF A ROTOR BLADE OF A WIND TURBINE GENERATOR SYSTEM, AND CORRESPONDING ROTOR BLADE

DR. JOHANNES HEIDENHAIN G...

1. A device for measuring deformations of a rotor blade of a wind turbine generator system, comprising:
an angle measuring device that includes a first and a second assembly, the first assembly being pivotable relative to the
second assembly about an axis, the second assembly having a fastening site that is configured to be connected to the rotor
blade, the angle measuring device being configured to measure a relative angular position between the first and the second
assembly; and

an arm having a connection site and being configured to be connected to the rotor blade at the connection site, the connection
site being disposed at a distance to the fastening site of the second assembly, the distance being oriented orthogonally to
the axis in a direction of extension of the arm,

wherein the arm is mechanically coupled to the first assembly at a radial distance such that, in response to a change in the
distance, a relative angular displacement is generated between the first and the second assembly.

US Pat. No. 9,739,598

DEVICE FOR INTERFERENTIAL DISTANCE MEASUREMENT

DR. JOHANNES HEIDENHAIN G...

1. A device for interferential distance measurement between two objects movable with respect to each other along at least
one shifting direction, comprising:
at least one light source;
at least one splitting element adapted to split a beam of rays emitted by the light source at a splitting location into at
least two partial beams that propagate onward at different angles;

at least one deflecting element adapted to deflect the partial beams striking it in a direction of a merging location, where
the split partial beams are interferingly superimposed and where optical paths of the partial beams between the splitting
location and the merging location are adapted such that traversed optical path lengths of the partial beams between the splitting
location and the merging location are identical in the event of a change of distance between the two objects; and

at least one detector system adapted to detect distance-dependent signals from the superimposed pair of interfering partial
beams.

US Pat. No. 9,772,204

LENGTH-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A length-measuring device comprising:
a scale extending in a longitudinal direction and having a measuring graduation for position measurement in the longitudinal
direction;

at least one mounting element by which the scale is attachable to a support such that the scale is fixed in the longitudinal
direction, the at least one mounting element having a first fastening portion by which the at least one mounting element is
stationarily attached to the scale and a second fastening portion configured to be stationarily attached to the support; and

an arrangement of a plurality of flexible struts between the first fastening portion and the second fastening portion which,
through flexure, allows the first fastening portion to move relative to the second fastening portion perpendicularly to the
longitudinal direction, the arrangement of struts being configured to compensate for a flexure-induced change in length of
the struts in such a way that no movement will result from the flexure-induced change in length between the first fastening
portion and the second fastening portion in the longitudinal direction.

US Pat. No. 9,733,109

ABSOLUTE POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An absolute position-measuring device, comprising:
a first subassembly having a measuring standard on which at least one coded track is provided, and a scanning unit adapted
to generate position signals for generation of an absolute digital position value by scanning the at least one coded track
in a measuring direction;

a second subassembly having at least one peripheral unit adapted to execute a supplementary or an auxiliary functionality
of the position-measuring device; and

a plurality of electrical lines connecting the first subassembly and the second subassembly to each other for transmission
of electrical signals;

wherein the position-measuring device is operable in an initialization mode and in a standard operating mode, all components
of the first subassembly required for operation in the standard operating mode being suitable for use in a radiation region
of a machine, the first subassembly including an initialization memory adapted to store data required for operation in the
standard operating mode and being unsuitable for use in a radiation region of a machine, content of the initialization memory
being transmittable in the initialization mode to a memory unit arranged outside the radiation region, the content of the
memory unit being is used for operation in the standard operating mode.

US Pat. No. 9,766,098

OPTICAL POSITION MEASURING INSTRUMENT

DR. JOHANNES HEIDENHAIN G...

1. An optical position measuring instrument for detecting a relative position of a scanning unit and a scale, said optical
position measuring instrument comprising:
a scale; and
a scanning unit, wherein said scanning unit and said scale are movable with respect to one another along a curved measurement
direction and wherein said scanning unit comprises:

a detector unit; and
a reflector unit comprising;
a first wave front corrector;
a beam direction inverter; and
a second wave front corrector, wherein said reflector unit is disposed and/or embodied in said scanning unit so that partial
beams first pass through a first combination of said scale and said first wave front corrector, then via said beam direction
inverter, said partial beams are reflected back towards said scale, and said partial beams then pass through a second combination
of said scale and said second wave front corrector before said partial beams then arrive at said detector unit, wherein said
reflector unit has a structure so that it is ensured that wave front deformations of said partial beams, which result via
a first diffraction at said scale, are converted into wave front deformations that compensate for resultant wave front deformations
of said partial beams upon a second diffraction at said scale.

US Pat. No. 9,768,990

DEVICE FOR MANIPULATING INTERFACE SIGNALS

DR. JOHANNES HEIDENHAIN G...

1. A device for manipulating interface signals, comprising:
a slave interface connectable to a master interface of a control device and adapted to receive protocol-relevant interface
signals from the control device;

a master interface connectable to a slave interface of a measuring device and adapted to receive protocol-relevant interface
signals from the measuring device; and

a circuit configuration suppliable with at least one data-input signal per interface and adapted to output a corresponding
data-output signal per data-input signal to a respective other interface, each data-input signal being included in a respective
protocol-relevant interface signal;

wherein the circuit configuration includes at least one manipulation unit, to which a data-input signal and a substitute-data
signal are input and adapted to output a corresponding data-output signal, and a protocol unit, to which the protocol-relevant
interface signals are suppliable and adapted to choose, based on manipulation rules and based on information included in the
protocol-relevant interface signals, whether the output signal that is output by the at least one manipulation unit consists
of either (a) only the data-input signal that is input to the manipulation unit or (b) only the substitute-data signal that
is input to the manipulation unit.

US Pat. No. 9,766,097

MONITORING UNIT AND METHOD FOR MONITORING POSITION SIGNALS OF INCREMENTAL POSITION-MEASURING DEVICES

DR. JOHANNES HEIDENHAIN G...

1. A system, comprising:
an incremental graduation track;
a monitoring unit adapted to monitor position signals;
a scanning unit connected to the monitoring unit and adapted to scan the incremental graduation track, the scanning unit adapted
to generate at least two position signals by scanning the incremental graduation track, the at least two position signals
being out-of-phase with each other, the scanning unit adapted to output the at least two out-of-phase position signals to
an input of the monitoring unit;

wherein the monitoring unit includes:
a signal logic unit adapted to generate at least two position-dependent status data words from different combinations of the
out-of-phase position signals, the signal logic unit including at least two status counters adapted to count status changes
of respective combinations of the out-of-phase position signals and adapted to generate counter values as the status data
words; and

an evaluation unit, the status counters adapted to supply the counter values as the status data words to the evaluation unit,
the evaluation unit adapted to ascertain invalid statuses by comparing the counter values as the status data words and to
generate an error signal in response to an ascertained invalid status.

US Pat. No. 9,823,646

DEVICE AND METHOD FOR GENERATING A TRIGGER SIGNAL IN A POSITION-MEASURING DEVICE AND CORRESPONDING POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A method for generating an asynchronous trigger signal in a position-measuring device having a position-sensing unit, a
processing unit and an interface unit, the position-measuring device being connectable via the interface unit and a bidirectional
data channel to subsequent electronics for communication purposes, the method comprising:
generating a synchronous data stream from an asynchronous data stream arriving at the position-measuring device from a direction
of the subsequent electronics by sampling the asynchronous data stream in a time pattern of a clock signal;

generating a gate signal upon an enable condition for outputting the trigger signal being detected by evaluating the synchronous
data stream; and

generating the asynchronous trigger signal upon the gate signal being present and a signal edge of the asynchronous data stream
occurring.

US Pat. No. 9,923,445

DRIVE FOR AN XY-TABLE AND XY-TABLE

DR. JOHANNES HEIDENHAIN G...

1. A drive for an XY-table, comprising:
a stationary, ferromagnetic and U-shaped yoke having a first limb and a second limb that are located together in a plane;
movable ferromagnetic bar; and
a coil;
wherein the yoke and the bar are adapted to carry a magnetic circuit with a magnetic flux that takes a path across air gaps
between the limbs and the bar, and causes vertical reluctance forces in the air gaps that counteract a gravitational force
of the bar;

wherein the bar is parallel to and below the plane;
wherein the yoke includes a permanent magnet adapted to generate the magnetic flux, the permanent magnet arranged in a closed
end, joining the first and second limbs of the U-shaped yoke; and

wherein the coil is wound about the closed end of the yoke and is adapted to influence the magnetic flux so that a vertical
reluctance force acting on the bar is adjustable.

US Pat. No. 9,923,452

SWITCHED-MODE POWER SUPPLY FOR POWERING A FREQUENCY CONVERTER

DR. JOHANNES HEIDENHAIN G...

1. A switched-mode power supply for supplying an operating voltage to a frequency-converter, the switched-mode power supply
comprising:
a supply capacitor configured to supply the operating voltage to a control device for generating control signals for semiconductor
switches of the switched-mode power supply; and

a start-up circuit from a DC link of the frequency converter by which the supply capacitor is chargeable, the start-up circuit
including a current regulator that is configured to maintain a constant total current from the DC link to the start-up circuit,
wherein a valve of the current regulator that controls the total current is configured to act only on a first partial current
which, together with a second partial current, makes up the total current, the second partial current including a leakage
current of the control device and a charging current of the supply capacitor, wherein none of the first partial current acted
on by the valve flows to the control device.

US Pat. No. 10,018,485

SCALE AND POSITION-MEASURING DEVICE HAVING SUCH A SCALE

DR. JOHANNES HEIDENHAIN G...

1. A scale for an optically scanning position-measuring device, the scale comprising:a carrier;
a reflective layer disposed on the carrier;
a transparent spacer layer disposed on the reflective layer, the spacer layer having a patterned, partially transparent layer thereon which defines a bright/dark pattern in which regions having the partially transparent layer appear dark and regions without the partially transparent layer appear bright; and
a sealing layer disposed on the patterned, partially transparent layer,
wherein products of refractive index and layer thickness are the same for the spacer layer and the sealing layer, or differ by an odd multiple.

US Pat. No. 9,921,468

X-Y TABLE WITH A POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An X-Y table with a position-measuring device, comprising:
a table which is disposed on a support that is movable relative to a underlying stationary base in one of two orthogonal directions
of a plane of the table, the table being movable on the support in the other of the two directions so that altogether the
table is positionable in a plane parallel to the underlying stationary base; and

two groups of scanning heads disposed on the support, each of the two groups of scanning heads including at least two scanning
heads, wherein, for position measurement in each of the two directions, a respective one of the scanning heads is configured
to direct light through a respective transmissive scale attached along an edge of the table such that a respective reflective
scale, which is stationary relative to a processing tool disposed above the table, reflects the light through the respective
transmissive scale back to the respective scanning head,

wherein, in a central position of the table, the at least two scanning heads of each of the two groups of scanning heads are
in positional correspondence with the transmissive scales, and, in either of two edge positions of the table, only the at
least two scanning heads of one of the two groups of scanning heads is in positional correspondence with the transmissive
scales.

US Pat. No. 9,958,296

INDUCTIVE POSITION-MEASURING DEVICE FOR ABSOLUTE POSITION DETERMINATION

DR. JOHANNES HEIDENHAIN G...

1. An inductive position-measuring device for absolute position determination, comprising:a scale having a first measuring graduation extending in a measurement direction and a second measuring graduation disposed opposite to the first measuring graduation and extending parallel thereto;
a scanner disposed in a gap between the first measuring graduation and the second measuring graduation, the scanner being displaceable relative to the scale in the measurement direction for purposes of position measurement, the scanner including a first coil arrangement for scanning the first measuring graduation and generating a first position-dependent scanning signal, and a second coil arrangement, disposed opposite to the first coil arrangement, for scanning the second measuring graduation and generating a second position-dependent scanning signal; and
at least one intermediate ply of soft magnetic material disposed between the first coil arrangement and the second coil arrangement.

US Pat. No. 10,120,359

DEVICE AND METHOD FOR THE AUTOMATED DETECTION OF AN INTERFACE

DR. JOHANNES HEIDENHAIN G...

1. A device for automated detection of an interface between a position-measuring device and sequential electronics that are interconnected via a data-transmission channel, the position-measuring device including an interface unit and a position-measuring unit, the interface unit being connected to the data-transmission channel and to the position-measuring unit to exchange data, an interface to the sequential electronics being selectable in the interface unit from at least two interfaces, comprising:an interface-detection unit arranged in the position-measuring device and adapted to be supplied with at least one input signal from the sequential electronics via the data transmission channel, and includes a device adapted to determine a time sequence of signal edges of the at least one input signal in conjunction with a signal state; and
an evaluation unit adapted to ascertain an interface used by the sequential electronics by evaluation of the determined time sequence of signal edges, the interface selectable in the interface unit;
wherein the interface unit includes at least two specific interface modules, each specific interface module assigned to a single corresponding interface, the interface unit adapted to select the interface by selection of the corresponding specific interface module, each specific interface module adapted to communicate with the sequential electronic via the data transmission channel utilizing data and/or commands having a first respective format;
wherein the interface unit further includes a single general interface module connected to the specific interface modules via a standard interface and connected to the position-measuring unit, the general interface module adapted to communicate with the selected specific interface module utilizing data and/or commands having a second format; and
wherein each specific interface module is adapted to convert commands and/or data, received from the sequential electronics via the data transmission channel, from the first respective format to the second format for transmission to the position-measuring unit via the general interface module and/or to convert commands and/or data, received from the position-measuring unit via the general interface module, from the second format to the first respective format for transmission to the sequential electronics via the corresponding specific interface module and the data transmission channel.

US Pat. No. 10,082,410

OPTICAL POSITION MEASURING DEVICE FOR GENERATING WAVELENGTH-DEPENDENT SCANNING SIGNALS

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device, comprising:a scanning unit;
a reflective material measure that is movable relative to the scanning unit in at least one measuring direction, wherein the optical position-measuring device is configured to generate a plurality of phase-shifted scanning signals indicative of a relative position of the scanning unit and of the material measure from superimposed sub-beams generated by interaction of the scanning unit and the material measure, wherein phase relations of the generated phase-shifted scanning signals are wavelength-dependent; and
a detection unit including a splitting device and an optoelectronic detector arrangement, the splitting device being configured to separate the superimposed sub-beams incident thereon as a function of wavelength, the splitting device being configured as an asymmetrical interferometer that includes two interferometer arms having different optical path lengths, within which the sub-beams propagate between splitting and recombination until the recombined sub-beams arrive at the optoelectronic detector arrangement.

US Pat. No. 10,048,114

DEVICE FOR MEASURING THE VIBRATIONAL AMPLITUDE OF A CAPILLARY TUBE OF A WIRE BONDER

DR. JOHANNES HEIDENHAIN G...

1. A device for measuring a vibrational amplitude of a capillary tube of a wire bonder, comprising:a light source adapted to emit a beam of light;
a first imaging optic systems located downstream from the light source in a light propagation direction;
a second imaging optic system; and
a detector system adapted to ascertain the vibrational amplitude of the capillary tube placed between the light source and the detector system from the shading of the beam of light by the capillary tube;
wherein the beam of light emitted by the light source is split into a measuring beam of light and a reference beam of light, an edge of the capillary tube at least partially shading the measuring beam of light in a vibrating state, while the reference beam of light is not shaded;
wherein the detector system includes a measuring detector assigned to the measuring beam of light and at least one reference detector assigned to the reference beam of light, the measuring detector and the reference detector being connected to each other, the vibrational amplitude of the capillary tube being ascertainable from output signals of the measuring detector and the reference detector;
wherein the first imaging optic system is adapted to image the light source in the measuring beam of light and in the reference beam of light into an image plane in which the capillary tube vibrates;
wherein the second imaging optic system is located between the image plane and the detector system, the second imaging optic system adapted to focus the measuring beam of light and the reference beam of light into a detection plane and/or into a diaphragm plane; and
wherein, adjacent to the detection plane or in the diaphragm plane:
(a) a first diaphragm aperture is located in the measuring beam of light, the measuring detector being located downstream from the first diaphragm aperture in the light propagation direction; and
(b) a second diaphragm aperture is located in the reference beam of light, the reference detector being located downstream from the second diaphragm aperture in the light propagation direction.

US Pat. No. 9,863,791

OPTICAL POSITION-MEASURING DEVICE HAVING INCREMENTAL DETECTOR AND ABSOLUTE DETECTOR DISPOSED IN A COMMON DETECTION PLANE AT A DEFINED PERPENDICULAR DISTANCE FROM A SCANNING GRATING

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for absolute position determination, comprising:
a material measure extending along a measurement direction and including at least one incremental graduation and an absolute
code; and

a scanning unit which is movable relative to the material measure along the measurement direction, the scanning unit having
alight source, a scanning grating for optically scanning the incremental graduation and a detector device, the detector device
including an incremental detector configured to generate incremental signals from the optical scanning of the incremental
graduation and an absolute detector configured to generate absolute signals from optical scanning of the absolute code, the
incremental detector and the absolute detector being disposed in a common detection plane, the detection plane being located
at a defined perpendicular distance front the scanning grating and/or a periodicity of a fringe pattern on the incremental
detector being selected such that, in the event of scattering contamination in a region of the material measure and/or the
scanning grating, amplitudes of the incremental signals and amplitudes of the absolute signals drop off equally.

US Pat. No. 10,119,802

OPTICAL POSITION-MEASURING DEVICE HAVING GRATING FIELDS WITH DIFFERENT STEP HEIGHTS

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device, comprising:a scale and a scanning reticle, whose relative position is determinable in three linearly independent spatial directions using a plurality of interfering light beams, two of the spatial directions being parallel to a plane of the scale and parallel to a plane of the scanning reticle, and the other one of the spatial directions having a component being perpendicular thereto;
a splitter grating disposed on the scanning reticle and adapted to split light into a plurality of sub-beams of different diffraction orders;
an optical grating disposed on the scale and adapted to further split the sub-beams and to recombine the further split sub-beams after the further split sub-beams have been reflected back from the scanning reticle;
a plurality of grating fields configured as phase gratings disposed on a side of the scanning reticle that faces the scale, the grating fields acting as diffractive optics that influence the further split sub-beams, each of the grating fields comprising a plurality of graduation periods and a same step height, the step heights of the grating fields being different from each other; and
an output grating disposed on the scanning reticle and adapted to output, as interfering sub-beams, light that has been multiply reflected between the scale and the scanning reticle.

US Pat. No. 9,927,234

POSITION-MEASURING DEVICE AND METHOD FOR OPERATING THE SAME

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device having a module configured to vary a signal period of at least one position-dependent sinusoidal analog scanning signal, comprising:a conversion unit configured to receive the sinusoidal analog scanning signal and to generate therefrom at least one sinusoidal digital output signal having a varied signal period compared to the sinusoidal analog scanning signal; and
a digital-to-analog converter configured to generate, from the sinusoidal digital output signal, a sinusoidal analog output signal having a varied signal period,
wherein the conversion unit is configured to change an operating mode in dependence upon a frequency of the sinusoidal analog scanning signal in such a way that in a case of higher frequencies of the sinusoidal analog scanning signal, the sinusoidal digital output signal is fed to the digital-to-analog converter at a higher output rate and with a smaller word width than in a case of lower frequencies of the sinusoidal analog scanning signal.

US Pat. No. 9,874,434

POSITION-MEASURING SYSTEM, HAVING SCANNING UNITS MULTIPLEXED TO LIGHT SOURCES AND DETECTORS, FOR OPTICALLY SCANNING A MEASURING STANDARD AND METHOD FOR OPERATING SUCH A POSITION-MEASURING SYSTEM

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring system, comprising:
a plurality of light sources that operate in temporal succession to emit light pulses in temporal order;
a plurality of detectors;
at least one measuring standard including a substrate and a grating provided on the substrate;
a plurality of optical scanners adapted to optically scan the measuring standard, the scanners being coupled optically to
the detectors and a respective light source; and

a plurality of demultiplexers arranged between the scanners and the detectors, each demultiplexer adapted to couple at least
two scanners to one detector;

a plurality of multiplexers adapted to couple the light sources to the scanners, each multiplexer adapted to split one primary
illuminating channel of a light source received on an input side of the multiplexer into a plurality of secondary illuminating
channels on an output side of the multiplexer and direct the secondary illuminating channels to the scanners; and

wherein the scanners are arranged such that per scanner, a plurality of phase-shifted optical scanning signals are generatable
and are routable via a plurality of primary detection channels to an input side of the demultiplexers, each demultiplexer
having an output side and being adapted to combine the routed primary detection channels on the output side onto a single
respective secondary detection channel and direct the secondary detection channel to a single respective detector.

US Pat. No. 9,942,524

DEVICE AND METHOD FOR DETECTING THE POSITION OF AN OBJECT IN A MACHINE TOOL

DR. JOHANNES HEIDENHAIN G...

1. A device for detecting the position of an object in a machine tool, the device comprising:a camera configured to provide an image of the object and an object carrier to which the object is connected and whose position within the machine tool is known;
a first processing unit configured to identify a position of the object relative to the camera based on geometric features of the object which are obtained from the image;
a second processing unit configured to identify a position of the object carrier relative to the camera based on geometric features of the object carrier which are obtained from the image; and
a third processing unit configured to determine a position of the object relative to the object carrier from the identified positions of the object and the object carrier relative to the camera.

US Pat. No. 10,234,277

LENGTH-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A length-measuring device, comprising:a carrier extending longitudinally in a measurement direction, a scale having a measuring graduation being disposed on the carrier;
a scanning carriage configured to scan the measuring graduation, the scanning carriage being guided longitudinally in the measurement direction on at least one guide surface;
a coupling which couples the scanning carriage to a drive dog rigidly in the measurement direction and resiliently transversely to the measurement direction, the coupling including a connecting element which extends in the measurement direction and is rotatably mounted to the scanning carriage at a first pivot joint and to the drive dog at a second pivot joint spaced apart from the first pivot joint in the measurement direction;
a first spring disposed between the connecting element and the drive dog, the first spring exerting a pressure force on the scanning carriage at a first position so as to press the scanning carriage against the at least one guide surface; and
a second spring disposed between the connecting element and the scanning carriage, the second spring being spaced apart from the first spring in the measurement direction and exerting a pressure force on the scanning carriage at a second position spaced apart from the first position in the measurement direction so as to press the scanning carriage against the at least one guide surface.

US Pat. No. 10,215,792

POSITION-MEASURING DEVICE, CONNECTABLE VIA A DATA-TRANSMISSION CHANNEL TO TRANSMIT DATA, INCLUDING A DETECTION UNIT ADAPTED TO DETECT PRESENCE, OR NON-PRESENCE OF A PAIR OF LINES

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device for determining a position of two objects movable relative to each other, which during operation, generates data in the form of measured position values, the position-measuring device connectable to a processing unit via a differential data-transmission channel in order to transmit data, the position-measuring device connectable to the processing unit via (a) a first pair of lines of the differential data-transmission channel or (b) a first pair of lines of the differential data-transmission channel and at least one further pair of lines of the differential data-transmission channel, the position-measuring device comprising:a detection unit adapted to detect a presence or non-presence of at least one further pair of lines of the differential data transmission channel, when the position-measuring device is connected to the processing unit via the differential data-transmission channel, by detection of a terminating resistor that is located in the processing unit and that is provided in the presence of the further pair of lines of the differential data transmission channel;
wherein the terminating resistor connects the lines of the further pair of lines to each other;
wherein the detection unit is adapted to detect the presence of the further pair of lines by checking whether the pair of lines and the terminating resistor form an electric circuit; and
wherein the detection unit includes a voltage source adapted to impart a voltage on at least one of the further pair of lines and a comparator adapted to compare the voltage on at least another one of the further pair of lines to a reference voltage to check whether the terminating resistor, that is located in the processing unit, and the further pair of lines form an electric circuit.

US Pat. No. 10,094,961

OPTICAL LAYER SYSTEM

DR. JOHANNES HEIDENHAIN G...

1. An optical layer system for a position-measuring device, comprising:at least first, second and third functional surfaces disposed on a surface of a transparent substrate, each of the functional surfaces having a different optical function, wherein the functional surfaces are composed of a first layer stack and a second layer stack,
wherein the first functional surface is formed by the first layer stack and acts as an antireflection coating, and the third functional surface is formed by the second layer stack and acts as a mirror, and
wherein the second functional surface is formed by the first and second layer stacks being alternately arranged with respect to each other at intervals of less than 1 mm so as to act as an optical grating.

US Pat. No. 9,869,547

POSITION-MEASURING DEVICE AND METHOD FOR TESTING A CLOCK SIGNAL

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device for measuring a position of an object, comprising:
a position sensor configured to generate digital position values;
a processor configured to process instructions from subsequent electronics;
an interface configured to communicate with the subsequent electronics, according to rules of an interface protocol, via at
least one interface line configured to transmit interface signals having a temporal behavior determined by the interface protocol
so as to transmit the instructions from the subsequent electronics to the processor;

a clock generator configured to generate a clock signal that serves as a time base for functions of the position sensor and
the processor; and

a time measurer configured to use the clock signal as a time base, to receive at least one of the interface signals and to
measure a time interval between a start event and a stop event of the at least one of the interface signals,

wherein the processor is configured to receive the measured time interval and transmit the measured time interval, via the
interface, to the subsequent electronics for further processing.

US Pat. No. 10,060,772

METHOD FOR CORRECTING ERRORS IN POSITION-MEASURING DEVICES

DR. JOHANNES HEIDENHAIN G...

1. A method for correcting errors in position values generated by a position-measuring device having a material measure which is scanned by at least one scanning unit, the method comprising:obtaining correction values for a defined number of correction points on the material measure in a calibration performed prior to a measurement operation;
compressing the correction values from the calibration for the measurement operation; and
using the compressed correction values during the measurement operation to correct the position values generated by the position-measuring device.

US Pat. No. 9,923,573

METHOD AND DEVICE FOR READING A SERIAL DATA STREAM

DR. JOHANNES HEIDENHAIN G...

1. A method for reading a serial data stream in a piece of automation technology equipment, the method comprising:
encoding the data stream to include at least two symbols which are each distinguishable by a time interval between two successive
signal edges;

measuring the time interval for a current symbol to be currently associated as a current symbol duration, and at least one
old symbol duration of a preceding one of the symbols;

associating a time sequence of the signal edges with a respective one of the symbols based on a period of time including the
current symbol duration and the at least one old symbol duration.

US Pat. No. 10,393,491

LENGTH-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A length-measuring device for measuring a relative position of two objects with respect to each other, the length-measuring device comprising:a hollow section member in which a scale tape extends, in a tensioned state, in a longitudinal direction;
a mounting block disposed at each end of the scale tape, the scale tape being attached to each of the mounting blocks; and
an adjuster configured to position at least a first one of the mounting blocks on the hollow section member in a first installed condition such that the first one of the mounting blocks is displaceable in the longitudinal direction, the adjuster being movably mounted on the hollow section member and capable of being brought from a first position to a second position, the first one of the mounting blocks being in the first installed condition in a state in which the adjuster is in the first position, the first one of the mounting blocks being movable to a second installed condition by moving the adjuster to the second position, wherein, in the second installed condition, the first one of the mounting blocks is fixed in a nominal position defined by the adjuster on the hollow section member.

US Pat. No. 10,378,926

SCALE AND POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A scale for inductive position measurement along a measurement direction X, the scale comprising:a support channel made of electrically conductive material and having two interconnected spaced-apart side walls extending parallel to the measurement direction X and enclosing an interstitial space therebetween;
a succession of first graduations made of electrically conductive material, the succession of first graduations being disposed on the support channel, located in the interstitial space opposite and spaced from one of the two side walls and extending parallel to the measurement direction X; and
a succession of second graduations made of electrically conductive material, the succession of second graduations being disposed on the support channel, located in the interstitial space opposite and spaced from the other one of the two side walls and extending parallel to the measurement direction X,
wherein the succession of first graduations and the succession of second graduations form a gap configured to receive a scanner operable to inductively scan the first graduations together with the second graduations.

US Pat. No. 10,488,190

LENGTH-MEASURING DEVICE AND METHOD FOR ASSEMBLING THE SAME

DR. JOHANNES HEIDENHAIN G...

1. A length-measuring device, comprising:a hollow section member having a scale disposed therein, the hollow section member having a slot which extends along the scale, wherein, during position measurement, a drive dog of a scanning unit scanning the scale extends through the slot, the slot being sealed by an elastic seal extending along the hollow section member; and
a sleeve attached to at least one end of the seal in a pull-off resistant manner, the sleeve having an axial abutment which is effective in a longitudinal direction of the hollow section member and with which the sleeve bears axially against the hollow section member.

US Pat. No. 9,880,547

NUMERICAL CONTROL

DR. JOHANNES HEIDENHAIN G...

1. A numerical control for operating a machine tool having a plurality of axes, comprising:
a drive controller for each axis to be actuated, the drive controller is configured to be parameterized via machine parameters
and adaptable to a plurality of machine tools;

wherein variable control values and machine parameters are selectable at tapping points in the drive controllers in order
to be used as at least one of (a) arguments and (b) parameters of a user-defined function to calculate an output value;

wherein the output value is adapted for function-dependent influence of one of the drive controllers by the variable control
values and machine parameters selected at the tapping points in the drive controllers;

wherein the user-defined function is selectable from a plurality of functions included in a function library;
wherein the function library includes polynomials of different degrees, trigonometric functions and/or second-order filters;
wherein the output value is feedable back to a feedforward point in one of the drive controllers at least one of (a) in an
additive manner, (b) in a multiplicative manner, and (c) by mathematical convolution; and

wherein at least one tapping point for at least one of (a) an argument and (b) a parameter of the user-defined function is
located in a different drive controller than the feedforward point.

US Pat. No. 10,203,230

MULTITURN ROTARY ENCODERS

DR. JOHANNES HEIDENHAIN G...

1. A multiturn rotary encoder, comprising:a measuring standard having at least one graduation track that encodes an absolute angular position of a shaft;
a first scanner adapted to scan the graduation track in order to generate first position signals;
a first single-turn evaluation unit adapted to form a first single-turn code word from the first position signals;
a first multiturn evaluation unit adapted to form a first multiturn code word from the first position signals;
a second scanner adapted to scan the graduation track in order to generate second position signals;
a second single-turn evaluation unit adapted to form a second single-turn code word from the second position signals;
a second multiturn evaluation unit adapted to form a second multiturn code word from the second position signals;
a battery adapted to supply energy to the first multiturn evaluation unit and the second multiturn evaluation unit upon loss of a main power supply; and
a first battery-monitoring unit adapted to monitor functioning of the battery and to indicate the functioning of the battery by at least one battery-status signal;
wherein the first battery-monitoring unit includes a state-of-charge monitoring unit adapted to determine and indicate a state of charge of the battery by a first battery-status signal; and
wherein the first battery-monitoring unit includes a continuity-monitoring unit adapted to determine an interruption of presence of a battery voltage of the battery and to indicate the interruption of the presence of the battery voltage by a second battery-status signal.

US Pat. No. 10,503,142

METHOD AND DEVICE FOR CONTROLLING A MILLING MACHINE

DR. JOHANNES HEIDENHAIN G...

8. A numerical control for controlling a milling operation on a machine tool, comprising:a monitor unit adapted to monitor a temporally variable parameter of the numerical control with the aid of a limit value;
an averaging filter adapted to filter out a tooth-meshing frequency of a milling tool from a time characteristic of the parameter; and
a scanning rate converter adapted to process the parameter, measured in a fixed clock rate, and to output the parameter with a variable clock pulse for further processing;
wherein the variable clock pulse corresponds to a multiple of the tooth-meshing frequency of the milling tool, the tooth-meshing frequency corresponding to a product of a rate of rotation of the milling tool and a number of cutting blades of the milling tool; and
wherein the tooth-meshing frequency is filtered out of the parameter output with a variable clock rate by averaging, by a moving-average filter, across a number of values that corresponds to the multiple of the tooth-meshing frequency.

US Pat. No. 10,378,991

ANGLE-MEASURING DEVICE AND METHOD FOR OPERATING AN ANGLE-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An angle-measuring device comprising:a housing;
a shaft rotatably supported in the housing by a bearing, the shaft being mechanically rigidly coupleable by a connector to a shaft of a machine, a portion of the bearing that is stationary with respect to the shaft being mechanically flexibly connected to the housing via a coupling;
a position sensor configured to generate angle values indicating an angular position of the shaft with respect to a reference position;
an interface configured to communicate with subsequent electronics via a data channel;
at least one imbalance sensor configured to generate an imbalance signal from imbalance-induced excursions of the shaft;
an imbalance analyzer configured to generate imbalance values from the imbalance signal; and
a signal processor configured to generate imbalance information from the angle values and the imbalance values, the imbalance information being transmittable through the interface to the subsequent electronics.

US Pat. No. 10,209,103

LINEAR ENCODER

DR. JOHANNES HEIDENHAIN G...

1. A linear encoder, comprising:a scale disposed within a housing;
a scanning unit that is displaceable in a measuring direction relative to the scale, the scanning unit comprising:
a scanning head disposed inside of the housing opposite to the scale such that the scale is scannable by the scanning head,
a mount to which the scanning head is fastened, and
a driving component, via which the mount is coupled to a mounting base disposed outside of the housing, wherein the driving component, in the measuring direction, is flexurally stiff, and, in a second direction that is orthogonal to the measuring direction, is relatively thin; and
a vibration damper including a damping mass and an elastic element, the damping mass being fastened by the elastic element to an attachment surface of the mount which is a plane that is defined by the measuring direction and the second direction, wherein the elastic element is an adhesive layer between the mount and the damping mass and is configured to allow the damping mass to move in the second direction so as to suppress vibrations transversely to the measurement direction.

US Pat. No. 10,060,731

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for measuring a relative position of two objects that are movable relative to one another in a measuring direction, the optical position-measuring device comprising:a measuring graduation having a measuring graduation period; and
a scanner that is movable relative to the measuring graduation in the measuring direction, the scanner being configured to project a light pattern having bright and dark regions alternating in the measuring direction with a light pattern period onto the measuring graduation, the measuring graduation period differing from the light pattern period such that interaction of the light pattern with the measuring graduation produces a vernier pattern having bright regions and dark regions which are scanned by a detector array,
wherein the measuring graduation is a phase grating having a line-to-space ratio that is different from 1:1 and having a phase shift between lines and spaces that is selected such that the zeroth diffraction order is suppressed, and
wherein the position-measuring device is configured such that, at a position at which the zeroth diffraction order of a bright region of the incident light pattern is suppressed, at least one higher diffraction order is deflected and impinges on the detector array in one of the bright regions of the vernier pattern.

US Pat. No. 10,684,144

POSITION MEASURING DEVICE AND METHOD FOR OPERATING A POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position measuring device, comprising:a graduation carrier, a measuring graduation being provided on the graduation carrier;
a scanner unit configured to generate position-dependent scanning signals by scanning the measuring graduation;
a signal processor unit configured to process the scanning signals into position signals;
a modification unit;
a monitor unit configured to monitor at least one signal to be monitored and configured to output a modification signal to the modification unit based on monitoring the signal to be monitored;
subsequent electronics;
wherein the modification unit is configured to modify at least one of the position signals, which is supplied to the modification unit, for transmission of at least one status report and to output the modified position signal as an output signal to the subsequent electronics, the modification unit being configured to modify the position signal by adding a disturbance variable to the position signal.

US Pat. No. 10,645,810

SENSOR FOR MEASURING A POSITION

DR. JOHANNES HEIDENHAIN G...

1. A sensor for measuring a position of a component that is displaceable relative to the sensor, comprising:a circuit board having a first region, a detector located in the first region, a second region, and electronic components located in the second region and electrically connected to the detector; and
a metal body having a first layer including a first area and a second layer including a second area;
wherein the first region of the circuit board is fixed in place in the first area of the metal body, and the second region of the circuit board is fixed in place in the second area of the metal body; and
wherein the first layer of the metal body and the second layer of the metal body are arranged between the first region of the circuit board and the second region of the circuit board, the first region of the circuit board being located in a first plane, and the second region of the circuit board being disposed in a second plane.

US Pat. No. 10,352,675

LENGTH-MEASURING DEVICE HAVING A REMOVABLE TENSIONER FOR A SCALE TAPE

DR. JOHANNES HEIDENHAIN G...

1. A length-measuring device for measuring a relative position of two objects with respect to each other by scanning a measuring graduation of a scale tape, the length-measuring device comprising:a hollow section member in which the scale tape is tensioned along a longitudinal direction of the hollow section member; and
a tensioner device configured to tension the scale tape, the tensioner device comprising:
a fixed member which is fixed to the hollow section member and a tensioner which is held under tension on the fixed member by a spring acting in the longitudinal direction, wherein a line of action of the spring extends in alignment with the scale tape along the longitudinal direction of the hollow section member;
a holding member, wherein the scale tape is attached to the holding member, and wherein the tensioner is detachably secured to the holding member using a fastener such that the tensioner is separable from the holding member and removable from the hollow section member at an end by disconnecting the fastener;
an adjuster configured to adjust the tension of the scale tape.

US Pat. No. 10,197,388

POSITION-MEASURING DEVICE ABLE TO MONITOR DEVIATIONS FROM A SETPOINT BEHAVIOR AND METHOD FOR OPERATING THE POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device, comprising:a measuring standard;
an optical scanner unit adapted to scan the measuring standard for position-determination;
a rotary bearing, the measuring standard and the optical scanner unit being rotatable in relation to each other via the rotary bearing when the position-measuring device is in operation, the optical scanner unit adapted to generate output signals, on which an angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable; and
a monitor device adapted to monitor the rotary bearing for occurrence of bearing faults by detection and analysis of (a) an amplitude of the output signals of the optical scanner unit, on which the angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable, and/or (b) a phase of the output signals of the optical scanner unit, on which the angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable, at each of a plurality of different, specific relative positions of the measuring standard in relation to a detector device of the optical scanner unit during a revolution, by comparing (a) the amplitude of the output signals of the optical scanner unit, on which the angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable, and/or (b) the phase of the output signals of the optical scanner unit, on which the angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable, at each of the specific relative positions to a respective setpoint value for each specific relative position, the monitor device adapted to determine a bearing fault based on the detection, analysis, and comparison;
wherein (a) the amplitude of the output signals of the optical scanner unit, on which the angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable, and/or (b) the phase of the output signals of the optical scanner unit, on which the angle of rotation associated with the relative movement of the measuring standard and the optical scanner unit is determinable, constitutes a measured variable.

US Pat. No. 10,612,945

ANGLE MEASUREMENT SYSTEM

DR. JOHANNES HEIDENHAIN G...

1. An angle measurement system, comprising:a first component group including a first component and an angle scale;
a second component group including a second component and a scanning device, the scanning device adapted to generate a position signal as a function of position of the angle scale; and
bearing elements arranged between the first component group and the second component group, the first component group rotatably mounted about an axis relative to the second component;
wherein a gap extending in an axial direction is provided between the first component and the second component, the components arranged on both sides of the gap relative to each other without coming into contact; and
wherein:
(a) an annular first body is fixed in place on the first component and arranged without contact relative to the second component group, the second component including a section that is separated by a first radial gap and is located radially outside and across from a region of the first body extending in the axial direction, and the first body is arranged radially outside and circumferentially about the axis in relation to the bearing elements, and the first body is adapted to hold lubricant; and/or
(b) an annular second body is fixed in place on the second component and arranged without contact relative to the first component group, the first component including a section that is separated by a second radial gap and is located radially outside and across from a region of the second body extending in the axial direction, the second body being disposed radially outside and circumferentially around the axis in relation to the bearing elements, and the second body is able to hold lubricant.

US Pat. No. 10,571,310

POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device for determining a position of a first object with regard to a second object that is displaceable relative to the first object in at least one measuring direction, comprising:a measuring standard that extends along the measuring direction and that is connectable to the first object, the measuring standard including at least one periodic scale grating arranged as a transmission grating and having a first periodicity; and
a scanning unit connectable to the second object and including at least one light source, at least one periodic scanning grating having a second periodicity, and a detector system including detector regions that are sensitive to radiation and are periodically arranged in a detection plane at a third periodicity in the measuring direction;
wherein the light source is adapted to emit bundles of rays to first impinge upon the scale grating, to then pass through the scanning grating, to produce a periodic fringe pattern having the third periodicity in the detection plane from interaction of the bundles of rays with the scale grating and the scanning grating, the scanning unit adapted to generate a plurality of incremental signals that are phase-shifted relative to one another in accordance with scanning of the fringe pattern by the detector system;
wherein the scanning grating is arranged between at least one first transparent, plate-shaped carrier element and at least one second transparent, plate-shaped carrier element, a space between the scanning grating and the detector regions being completely filled with a material that has a refractive index of n>1.3; and
wherein a clearance between the scale grating and an adjacent boundary surface of the first carrier element is between 10 ?m and 200 ?m.

US Pat. No. 10,260,909

POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position measuring device, comprising:a measuring standard; and
a scanning unit;
wherein the measuring standard and the scanning unit are movable relative to each other in a measurement direction;
wherein the measuring standard includes a graduation that is scannable by the scanning unit to generate positional signals, the scanning unit including an illumination unit and a detector unit adapted to generate the positional signals, the illumination unit adapted to emit light in a direction of the graduation, the detector unit adapted to detect light modulated by the graduation, the detector unit including a circuit board and a sensor unit arranged as a semiconductor chip;
wherein at least two photodetectors are arranged on a front side of the sensor unit facing the graduation, electrical connections of the sensor unit routed to contact surfaces on a rear side by metallic vias, the sensor unit connected via the contact surfaces to corresponding contact surfaces on the circuit board;
wherein the sensor unit is directly connected to the circuit board via the contact surfaces of the sensor unit being directly solder-connected to the corresponding contact surfaces on the circuit board; and
wherein a scanning distance between the front side of the sensor unit and a surface of the graduation is less than 0.55 mm.

US Pat. No. 10,708,080

BUS SYSTEM AND SLAVE UNIT FOR A BUS SYSTEM

DR. JOHANNES HEIDENHAIN G...

1. A bus system having a daisy-chain configuration, the bus system comprising:a master unit; and
a plurality of slave units that are serially connected to the master unit downstream thereof via a line system, a first one of the slave units first connected downstream of the master unit being configured to invert a request signal, which is provided by the master unit and received via a first line section of the line system, and to output the inverted request signal on a second line section of the line system leading to an adjacent, second one of the slave units in the daisy-chain configuration,
wherein the bus system is configured to provide a differential signal transmission, and
wherein the first slave unit is further configured to invert an inverted response signal, which is provided by the second slave unit and received via the second line section, and to output based thereon a non-inverted response signal on the first line section leading to the master unit.

US Pat. No. 10,527,399

SCANNING UNIT FOR SCANNING A SCALE AND POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A scanning unit adapted for scanning a measuring graduation of a scale for purposes of position measurement in a measurement direction, wherein the scale is elongated and has a length extending along the measurement direction and wherein the scanning unit is configured to move in the measuring direction along the scale, the scanning unit comprising:a housing having a detector configured to generate position-dependent scanning signals;
an electrical lead that passes out through the housing in the measurement direction; and
a rotatable member in which the electrical lead is routed, the rotatable member having a first section extending in the measurement direction and a second section extending in a second direction at an angle relative to the measurement direction, wherein the rotatable member is rotatably mounted in an opening of a wall of the housing about an axis of rotation extending in the measurement direction and is configured to move with the scanning unit in the measurement direction for the purposes of position measurement,
wherein the rotatable member is lockable by a locking element, and wherein the locking element is formed by a screw which is threaded into a wall of the housing such that the rotatable member is clampable by the screw in a selected rotational position on the housing.

US Pat. No. 10,209,099

DEVICE AND METHOD FOR CHECKING A CLOCK SIGNAL OF A POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

12. A system, comprising:a position measuring device including an interface unit;
sequential electronics including an interface unit; and
a data transmission channel connecting the position measuring device and the sequential electronics, the data transmission channel including a data line adapted to transmit data signals from the interface unit of the position measuring device to the interface unit of the sequential electronics;
wherein the interface unit of the position measuring device includes a pulse generation unit adapted to generate a test pulse based on a time pattern of a clock signal of the position measuring device;
wherein the data line is adapted to transmit the test pulse to the interface unit of the sequential electronics;
wherein the interface unit of the sequential electronics includes a pulse measurement unit adapted to measure a pulse duration of the test pulse in the time pattern of a clock signal of the sequential electronics and to output, to a control unit for evaluation, a measured value representing the pulse duration.

US Pat. No. 10,627,262

SENSOR UNIT FOR POSITION MEASUREMENT

DR. JOHANNES HEIDENHAIN G...

1. A sensor unit for measuring a position of a component which is movable relative to the sensor unit, comprising:a metal body having a first opening;
an electronic component arranged in the first opening;
an electrically insulative molding compound filling a gap that is provided between the electronic component and the metal body;
an electrically insulative first layer applied on the electronic component and on the molding compound; and
a circuit trace electrically contacting the electronic component, being routed through the first layer in a first section, and extending on the first layer in a second section.

US Pat. No. 10,527,405

OPTICAL POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for sensing a position of two relatively movable objects, the optical position-measuring device comprising:a scale connected to one of the two objects and having a measuring graduation including a periodic arrangement of graduation regions along at least one graduation direction; and
a scanning unit disposed on the other one of the two objects and having a plurality of optical elements, an arrangement and design of the optical elements of the scanning unit resulting in a scanning beam path in which split and subsequently interfered sub-beams propagate mirror-symmetrically with respect to a plane of symmetry and impinge in a V-shape on the scale and/or are reflected back in a V-shape from the scale,
wherein the plane of symmetry is tilted by a defined tilt angle relative to the scale about an axis of rotation that is oriented parallel to a surface of the scale and extends perpendicular to the graduation direction, the sub-beams that are interfered being deflected at the measuring graduation into symmetric diffraction orders, and
wherein the sub-beams travel identical optical path lengths between splitting and recombination.

US Pat. No. 10,260,908

POSITION MEASURING DEVICE AND METHOD FOR OPERATING A POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position measuring device, comprising:a graduation carrier including a measuring graduation;
a scanning unit, the graduation carrier and the scanning unit being movable in a measuring direction relative to each other, the scanning unit adapted to generate position-dependent scanning signals by scanning the measuring graduation;
a signal processing unit adapted to process the scanning signals into positional signals;
a signal interface adapted to output the positional signals to subsequent electronics;
at least one correction unit provided in the signal processing unit adapted to correct at least one signal error of at least one scanning signal; and
a monitoring unit adapted to detect the signal error reaching a first limit value and to subsequently deactivate a corresponding correction unit.

US Pat. No. 10,222,192

METHOD FOR MACHINING A SCALE

DR. JOHANNES HEIDENHAIN G...

1. A method for machining a scale of a position-measuring system, the scale having, on a first surface, a measuring graduation and, on a second surface, is configured to be attached to a carrier body, a lateral peripheral side edge of the scale extending between the first and second surfaces, the first and second surfaces being bounded respectively by a first and a second edge in a region of the lateral peripheral side edge, the method comprising:machining the scale to produce a defined outer contour of the scale such that a raised ridge of material is formed at each of the first and second edges of the scale, the raised ridge of material in each case projecting from the respective associated surface of the scale,
wherein the scale is machined differently at the first edge than at the second edge in such a manner that a dimension of the raised ridge of material at the first edge perpendicular to the first surface is smaller than a dimension of the raised ridge of material at the second edge perpendicular to the second surface.

US Pat. No. 10,989,569

BEARINGLESS ANGULAR MEASUREMENT DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A bearingless angular measurement device, comprising:an angle scale;
a scanning unit;
a compensation coupling; and
an evaluation electronics;
wherein the scanning unit and the angle scale are located at a scanning distance relative to each other and are rotatable relative to each other about an axis;
wherein the scanning unit is adapted to generate angle-dependent output signals, the evaluation electronics adapted to process the output signals, the angular measurement device adapted to determine the scanning distance based on the output signals;
wherein the compensation coupling is attachable to a machine component and is elastically deformable in a direction of the axis;
wherein the machine component includes a brake pad of a brake of an electric motor; and
wherein an activation state of the brake is ascertainable based on the determined scanning distance and/or a wear state of the brake is determinable based on the determined scanning distance.

US Pat. No. 10,953,607

ARRANGEMENT HAVING A SCALE ATTACHED TO A CARRIER

DR. JOHANNES HEIDENHAIN G...

1. An arrangement comprising:a carrier; and
a scale disposed on the carrier in a spaced-apart relation therewith, the scale having a measuring graduation and being attached to the carrier via areally distributed and spaced-apart adhesive dots,
wherein the adhesive dots each include at least three spacers enclosed within an adhesive.

US Pat. No. 10,871,763

MANUALLY OPERATED MACHINE TOOL DISPLAY

DR. JOHANNES HEIDENHAIN G...

1. A display unit for a manually operated machine tool, the display unit comprising:a display including windows and text each associated with and indicating positions of different axes of the manually operated machine tool which are manually adjustable;
a memory storing configuration modes of the display including a stationary mode in which the windows and text provided in the display are each the same size and color, and at least one emphasis mode in which at least one of the window and text associated with one of the different axes of the manually operated machine tool is at least one of larger and a different color; and
a processor having access to the memory and being communicatively connected to position sensors of the different axes of the manually operated machine tool such that position signals indicating the positions of the different axes of the manually operated machine tool are received at the processor,
wherein the processor is configured to switch the display from using the stationary mode to using the at least one emphasis mode based on one of the position signals indicating that the position of one of the different axes is being moved by manual operation of an operator such that the window and text associated with the axis being adjusted is emphasized on the display.

US Pat. No. 10,775,202

OPTICAL POSITION-MEASURING DEVICE COMPRISING TWO TRACKS EACH CONTAINING INCREMENTAL GRADUATIONS WITH INTEGRATED REFERENCE MARKS HAVING APERIODIC AND PERIODIC PORTIONS

DR. JOHANNES HEIDENHAIN G...

1. An optical position-measuring device for determining the relative position of two objects that are movable relative to one another along at least two measurement directions, the optical position-measuring device comprising:two scanning units which are connected to a first one of the two objects and each include at least one light source, one or more gratings and a detector assembly, and
a scale which is connected to a second one of the two objects and has two tracks each containing incremental graduations extending along a first one of the measurement directions, the incremental graduations each being composed of graduation regions which have different optical properties and are periodically arranged along an incremental graduation direction, the two incremental graduation directions forming an angle of between 0° and 90° relative to each other, and each of the two incremental graduations having at least one reference mark integrated therein such that scanning of the reference mark allows a reference signal to be generated at a defined reference position along each of the measurement directions, the reference marks including both aperiodic and periodic portions.

US Pat. No. 10,749,412

POSITION-MEASURING DEVICE AND METHOD FOR OPERATING A POSITION-MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A position-measuring device, comprising:a graduation carrier which carries a measuring graduation and is non-rotatably connectable to a shaft;
a scanner configured to generate scanning signals by scanning the measuring graduation;
evaluation electronics configured to process the scanning signals into a digital angle value of the shaft; and
an interface configured to communicate with subsequent electronics,
wherein the scanner is mountable on a machine part that is supported so as to be movable in an axial direction of the shaft, so that the scanning signals are dependent on a position of the machine part in the axial direction of the shaft, and so that a measure of the position of the machine part in the axial direction of the shaft is determinable from the scanning signals by the evaluation electronics.

US Pat. No. 10,746,532

DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT

DR. JOHANNES HEIDENHAIN G...

1. A device for interferometric distance measurement, comprising:a multiple wavelength light source adapted to emit a light beam having at least three different wavelengths and arranged as a fiber laser including at least three different Bragg gratings having grating constants matched to the wavelengths;
an interferometer unit adapted to split up the light beam into a measuring light beam that propagates in a measuring arm in a direction of a measuring reflector and that is reflected back by the measuring reflector and into a reference light beam that propagates in a reference arm in a direction of a stationary reference reflector and that is reflected back by the reference reflector, the measuring and reference light beams reflected back by the measuring and reference reflectors being superimposed in an interfering manner to form an interference light beam;
a detection unit adapted to split the interference light beam to generate a plurality of phase-shifted partial interference signals for each wavelength; and
a signal processing device adapted to determine an absolute position of the measuring reflector from the partial interference signals of the different wavelengths;
wherein the multiple wavelength light source includes:
a pump light source;
at least three Bragg gratings integrated into at least one laser-active fiber, each Bragg grating having a phase shift of magnitude ?; and
coupling optics adapted to couple pump radiation emitted by the pump light source into the laser-active fiber.

US Pat. No. 10,989,515

INDUCTIVE POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An inductive position-measuring device, comprising:a scanning element; and
a graduation element rotatable about an axis relative to the scanning element;
wherein the scanning element includes: at least one exciter lead; a first receiver track including at least one receiver line that extends according to a first periodic pattern having a first period along a first direction; and a second receiver track including at least one receiver line;
wherein the graduation element includes a graduation track that extends in a circumferential direction in relation to the axis and has a graduation period along the circumferential direction; and
wherein the at least one exciter lead is adapted to generate an electromagnetic field, the graduation track is adapted to modulate the electromagnetic field, and the position-measuring device is adapted to detect an angular position of the graduation element relative to the scanning element with the aid of the receiver line of the first receiver track based on the modulated electromagnetic field and to detect a lateral position of the graduation element in the first direction relative to the scanning element with the aid of the receiver line of the second receiver track based on the modulated electromagnetic field.

US Pat. No. 10,914,615

SCANNING RETICLE INCLUDING A GRATING FORMED IN A SUBSTRATE FOR AN OPTICAL POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. A scanning reticle for an optical position measuring device, comprising:a silicon oxide substrate including an upper surface, operable in transmission, having different functional regions, at least one region having a grating including gaps and ribs, the gaps being formed in the substrate;
wherein the upper surface includes an antireflection layer that is discontinuous in a region of the gaps; and
wherein the antireflection layer includes a silicon layer arranged on the substrate and a silicon oxide layer arranged on the silicon layer.

US Pat. No. 10,823,550

OPTICAL POSITION MEASURING DEVICE

DR. JOHANNES HEIDENHAIN G...

1. An optical position measuring device for interferential determination of a relative distance of two objects that are movable relative to each other along at least one measuring direction, a bundle of rays emitted by a light source being split up into at least two partial bundles of rays, which are subsequently incident on a grating or a plurality of gratings on separate optical paths and undergo distance-dependent phase shifts, comprising:at least three detector elements; and
a mixing grating adapted to superimpose the partial bundle of rays so that at least three pairs of interfering partial beams of rays then propagate in different directions in space, the mixing grating adapted to focus each pair of interfering partial bundles of rays on a detector element, the detector elements adapted to detect at least three position-dependent, phase-shifted incremental signals.